Membership
Tour
Register
Log in
Junji Sugamoto
Follow
Person
Yokosuka, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and system for managing semiconductor manufacturing device
Patent number
7,979,154
Issue date
Jul 12, 2011
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for controlling semiconductor manufacturing apparatus and co...
Patent number
7,970,486
Issue date
Jun 28, 2011
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Grant
Process control system, process control method, and method of manuf...
Patent number
7,831,330
Issue date
Nov 9, 2010
Kabushiki Kaisha Toshiba
Junji Sugamoto
G05 - CONTROLLING REGULATING
Information
Patent Grant
Management system of semiconductor fabrication apparatus, abnormali...
Patent number
7,742,834
Issue date
Jun 22, 2010
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
Patent number
7,700,381
Issue date
Apr 20, 2010
Kabushikia Kaisha Toshiba
Tsunetoshi Arikado
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process control system, process control method, and method of manuf...
Patent number
7,596,421
Issue date
Sep 29, 2009
Kabushik Kaisha Toshiba
Junji Sugamoto
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method of inspecting semiconductor wafer
Patent number
7,531,462
Issue date
May 12, 2009
Kabushiki Kaisha Toshiba
Katsujiro Tanzawa
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection system, defect detection method, and defect detect...
Patent number
7,529,631
Issue date
May 5, 2009
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
Process-state management system, management server and control serv...
Patent number
7,324,855
Issue date
Jan 29, 2008
Kabushiki Kaisha Toshiba
Yukihiro Ushiku
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor wafer treatment method, semiconductor wafer inspectio...
Patent number
7,314,766
Issue date
Jan 1, 2008
Kabushiki Kaisha Toshiba
Junji Sugamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for monitoring manufacturing apparatuses
Patent number
7,221,991
Issue date
May 22, 2007
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
Patent number
7,057,259
Issue date
Jun 6, 2006
Kabushiki Kaisha Toshiba
Tsunetoshi Arikado
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and system for managing semiconductor manufacturing device
Publication number
20110245956
Publication date
Oct 6, 2011
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Application
Process control system, process control method, and method of manuf...
Publication number
20090276078
Publication date
Nov 5, 2009
Kabushiki Kaisha Toshiba
Junji Sugamoto
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND SYSTEM FOR MANAGING SEMICONDUCTOR MANUFACTURING DEVICE
Publication number
20080147226
Publication date
Jun 19, 2008
Hiroshi MATSUSHITA
G05 - CONTROLLING REGULATING
Information
Patent Application
Defect detection system, defect detection method, and defect detect...
Publication number
20080004823
Publication date
Jan 3, 2008
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Application
Management system of semiconductor fabrication apparatus, abnormali...
Publication number
20070276528
Publication date
Nov 29, 2007
Kabushiki Kaisha Toshiba
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Application
Method for controlling semiconductor manufacturing apparatus and co...
Publication number
20070225853
Publication date
Sep 27, 2007
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Application
Process control system, process control method, and method of manuf...
Publication number
20060287754
Publication date
Dec 21, 2006
Junji Sugamoto
G05 - CONTROLLING REGULATING
Information
Patent Application
Method of inspecting semiconductor wafer
Publication number
20060281281
Publication date
Dec 14, 2006
Katsujiro Tanzawa
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
Publication number
20060131696
Publication date
Jun 22, 2006
Kabushiki Kaisha Toshiba
Tsunetoshi Arikado
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process-state management system, management server and control serv...
Publication number
20060064188
Publication date
Mar 23, 2006
Yukihiro Ushiku
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for controlling manufacturing apparatuses
Publication number
20050194590
Publication date
Sep 8, 2005
Hiroshi Matsushita
G05 - CONTROLLING REGULATING
Information
Patent Application
Semiconductor wafer treatment method, semiconductor wafer inspectio...
Publication number
20040137752
Publication date
Jul 15, 2004
Junji Sugamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
Publication number
20030003608
Publication date
Jan 2, 2003
Tsunetoshi Arikado
H01 - BASIC ELECTRIC ELEMENTS