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JunJung Kim
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Paju-si, KR
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last 30 patents
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Patent Grant
Test structure and method of manufacturing structure including the...
Patent number
9,831,139
Issue date
Nov 28, 2017
Samsung Electronics Co., Ltd.
Shaofeng Ding
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Post-silicide spacer removal
Patent number
7,393,746
Issue date
Jul 1, 2008
International Business Machines Corporation
Thomas W. Dyer
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
TEST STRUCTURE AND METHOD OF MANUFACTURING STRUCTURE INCLUDING THE...
Publication number
20170207137
Publication date
Jul 20, 2017
Samsung Electronics Co., Ltd.
Shaofeng DING
G01 - MEASURING TESTING
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Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
Publication number
20160343708
Publication date
Nov 24, 2016
Jungil PARK
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Methods For Removing Gate Sidewall Spacers In CMOS Semiconductor Fa...
Publication number
20090017625
Publication date
Jan 15, 2009
Kyoung Woo Lee
H01 - BASIC ELECTRIC ELEMENTS