Junkei Kou

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer
- Patent number 11,315,781
- Issue date Apr 26, 2022
- Jeol Ltd.
- Masatoshi Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatus and mass analysis method
- Patent number 10,763,093
- Issue date Sep 1, 2020
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatus and mass analysis method
- Patent number 10,720,318
- Issue date Jul 21, 2020
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of adjusting same
- Patent number 9,373,493
- Issue date Jun 21, 2016
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of controlling same
- Patent number 9,012,837
- Issue date Apr 21, 2015
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight spectrometer having steady p...
- Patent number 8,754,367
- Issue date Jun 17, 2014
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,692,191
- Issue date Apr 8, 2014
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer having ion storage with timed pulse output
- Patent number 8,604,420
- Issue date Dec 10, 2013
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mass Spectrometry Apparatus and Mass Spectrometry Method
- Publication number 20230140037
- Publication date May 4, 2023
- JEOL Ltd.
- Shinichi Mukousaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20210175065
- Publication date Jun 10, 2021
- JEOL Ltd.
- Masatoshi Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analysis Apparatus and Mass Analysis Method
- Publication number 20190287783
- Publication date Sep 19, 2019
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analysis Apparatus and Mass Analysis Method
- Publication number 20190287784
- Publication date Sep 19, 2019
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Method of Controlling Same
- Publication number 20140138536
- Publication date May 22, 2014
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Method of Adjusting Same
- Publication number 20140138539
- Publication date May 22, 2014
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20120160998
- Publication date Jun 28, 2012
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20110291003
- Publication date Dec 1, 2011
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-Flight Mass Spectrometer
- Publication number 20110174967
- Publication date Jul 21, 2011
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Mass spectrometer

Mass analysis apparatus and mass analysis method

Mass analysis apparatus and mass analysis method

Mass spectrometer and method of adjusting same

Mass spectrometer and method of controlling same

Orthogonal acceleration time-of-flight spectrometer having steady p...

Mass spectrometer

Mass spectrometer having ion storage with timed pulse output

Patents Applicationslast 30 patents

Mass Spectrometry Apparatus and Mass Spectrometry Method

Mass Spectrometer

Mass Analysis Apparatus and Mass Analysis Method

Mass Analysis Apparatus and Mass Analysis Method

Mass Spectrometer and Method of Controlling Same

Mass Spectrometer and Method of Adjusting Same

Mass Spectrometer

Mass Spectrometer

Time-of-Flight Mass Spectrometer