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Junko Komori

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  • Itami, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card device
    • Patent number 6,480,012
    • Issue date Nov 12, 2002
    • Mitsubishi Denki Kabushiki Kaisha
    • Junko Komori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of detecting and analyzing impurities
    • Patent number 5,162,233
    • Issue date Nov 10, 1992
    • Mitsubishi Denki Kabushiki Kaisha
    • Junko Komori
    • G01 - MEASURING TESTING