Junko Konishi

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for optimizing observed image classification criterion and i...
- Patent number 9,020,237
- Issue date Apr 28, 2015
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for classifying defects and method for adjusting classification
- Patent number 8,892,494
- Issue date Nov 18, 2014
- Hitachi High-Technologies Corporation
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device, defect observation device, and manage...
- Patent number 8,779,360
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Kozo Miyake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image classification standard update method, program, and image cla...
- Patent number 8,625,906
- Issue date Jan 7, 2014
- Hitachi High-Technologies Corporation
- Yuya Isomae
- G01 - MEASURING TESTING
Information Patent Grant
Observation condition determination support device and observation...
- Patent number 8,472,696
- Issue date Jun 25, 2013
- Hitachi High-Technologies Corporation
- Junko Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting method, inspecting system, and method for manufacturing...
- Patent number 8,428,336
- Issue date Apr 23, 2013
- Hitachi, Ltd.
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing apparatus, program, defect inspection apparatus, defect r...
- Patent number 8,290,241
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection data handling and defect review tool
- Patent number 8,209,135
- Issue date Jun 26, 2012
- Hitachi High-Technologies Corporation
- Tomohiro Funakoshi
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method and manufacturing system of semiconductor device
- Patent number 8,043,772
- Issue date Oct 25, 2011
- Renesas Electronics Corporation
- Toshiharu Miwa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test data analyzing system and test data analyzing program
- Patent number 7,424,336
- Issue date Sep 9, 2008
- Hitachi High-Technologies Corporation
- Makoto Ono
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Inspecting method, inspecting system, and method for manufacturing...
- Patent number 7,068,834
- Issue date Jun 27, 2006
- Hitachi, Ltd.
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and method for manufacturing electronic devices u...
- Patent number 6,611,728
- Issue date Aug 26, 2003
- Hitachi, Ltd.
- Natsuyo Morioka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE, DEFECT OBSERVATION DEVICE, AND MANAGE...
- Publication number 20130112893
- Publication date May 9, 2013
- Kozo Miyake
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPTIMIZING OBSERVED IMAGE CLASSIFICATION CRITERION AND I...
- Publication number 20130077850
- Publication date Mar 28, 2013
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR CLASSIFYING DEFECTS AND METHOD FOR ADJUSTING CLASSIFICATION
- Publication number 20120117010
- Publication date May 10, 2012
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBSERVATION CONDITION DETERMINATION SUPPORT DEVICE AND OBSERVATION...
- Publication number 20110311125
- Publication date Dec 22, 2011
- Junko Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE CLASSIFICATION STANDARD UPDATE METHOD, PROGRAM, AND IMAGE CLA...
- Publication number 20110274362
- Publication date Nov 10, 2011
- Hitachi High-Techologies Corporation
- Yuya Isomae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION DATA HANDLING AND DEFECT REVIEW TOOL
- Publication number 20110211060
- Publication date Sep 1, 2011
- Hitachi High-Technologies Corporation
- Tomohiro Funakoshi
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD AND MANUFACTURING SYSTEM OF SEMICONDUCTOR DEVICE
- Publication number 20090286174
- Publication date Nov 19, 2009
- Renesas Technology Corp.
- Toshiharu MIWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT R...
- Publication number 20080226153
- Publication date Sep 18, 2008
- Makoto ONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer inspection data handling and defect review tool
- Publication number 20070105245
- Publication date May 10, 2007
- Hitachi High-Technologies Corporation
- Tomohiro Funakoshi
- G01 - MEASURING TESTING
Information Patent Application
Test data analyzing system and test data analyzing program
- Publication number 20070021855
- Publication date Jan 25, 2007
- Makoto Ono
- G05 - CONTROLLING REGULATING
Information Patent Application
Inspecting method, inspecting system, and method for manufacturing...
- Publication number 20060274932
- Publication date Dec 7, 2006
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for analyzing inspected data, apparatus and its program
- Publication number 20050114058
- Publication date May 26, 2005
- Makoto Ono
- G05 - CONTROLLING REGULATING

Junko Konishi

Person

Patents Grantslast 30 patents

Method for optimizing observed image classification criterion and i...

Device for classifying defects and method for adjusting classification

Charged particle beam device, defect observation device, and manage...

Image classification standard update method, program, and image cla...

Observation condition determination support device and observation...

Inspecting method, inspecting system, and method for manufacturing...

Analyzing apparatus, program, defect inspection apparatus, defect r...

Wafer inspection data handling and defect review tool

Manufacturing method and manufacturing system of semiconductor device

Test data analyzing system and test data analyzing program

Inspecting method, inspecting system, and method for manufacturing...

Inspection system and method for manufacturing electronic devices u...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE, DEFECT OBSERVATION DEVICE, AND MANAGE...

METHOD FOR OPTIMIZING OBSERVED IMAGE CLASSIFICATION CRITERION AND I...

DEVICE FOR CLASSIFYING DEFECTS AND METHOD FOR ADJUSTING CLASSIFICATION

OBSERVATION CONDITION DETERMINATION SUPPORT DEVICE AND OBSERVATION...

IMAGE CLASSIFICATION STANDARD UPDATE METHOD, PROGRAM, AND IMAGE CLA...

WAFER INSPECTION DATA HANDLING AND DEFECT REVIEW TOOL

MANUFACTURING METHOD AND MANUFACTURING SYSTEM OF SEMICONDUCTOR DEVICE

ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT R...

Wafer inspection data handling and defect review tool

Test data analyzing system and test data analyzing program

Inspecting method, inspecting system, and method for manufacturing...

Method for analyzing inspected data, apparatus and its program