Junqiang SHANG

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
High speed chip screening method using delay locked loop
- Patent number 8,548,773
- Issue date Oct 1, 2013
- Integrated Device Technology, Inc.
- Junqiang Shang
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring phase locked loop bandwidth parameters for hig...
- Patent number 8,254,515
- Issue date Aug 28, 2012
- Integrated Device Technology, Inc.
- Dongming Lou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
HIGH SPEED CHIP SCREENING METHOD USING DELAY LOCKED LOOP
- Publication number 20110098977
- Publication date Apr 28, 2011
- Integrated Device Technology, Inc.
- Junqiang SHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING PHASE LOCKED LOOP BANDWIDTH PARAMETERS FOR HIG...
- Publication number 20100246739
- Publication date Sep 30, 2010
- Integrated Device Technology, Inc.
- Dongming Lou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE