Junqing Huang

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Design-assisted inspection for DRAM and 3D NAND devices
- Patent number 11,783,470
- Issue date Oct 10, 2023
- KLA Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-assisted inspection for DRAM and 3D NAND devices
- Patent number 11,308,606
- Issue date Apr 19, 2022
- KLA Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection using difference images
- Patent number 11,270,430
- Issue date Mar 8, 2022
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects in a logic region on a wafer
- Patent number 10,923,317
- Issue date Feb 16, 2021
- KLA Corp.
- Junqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 10,605,744
- Issue date Mar 31, 2020
- KLA-Tencor Corp.
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nuisance reduction using location-based attributes
- Patent number 10,600,177
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual feedback for inspection algorithms and filters
- Patent number 10,599,944
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive local threshold and color filtering
- Patent number 10,395,359
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defining care areas in repeating structures o...
- Patent number 10,339,262
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 9,880,107
- Issue date Jan 30, 2018
- KLA-Tencor Corp.
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive local threshold and color filtering
- Patent number 9,704,234
- Issue date Jul 11, 2017
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on wafers based on 2D scatter plots of values det...
- Patent number 9,619,876
- Issue date Apr 11, 2017
- KLA-Tencor Corp.
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scratch filter for wafer inspection
- Patent number 9,442,077
- Issue date Sep 13, 2016
- KLA-Tencor Corp.
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Grant
Tuning wafer inspection recipes using precise defect locations
- Patent number 9,224,660
- Issue date Dec 29, 2015
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 9,053,527
- Issue date Jun 9, 2015
- KLA-Tencor Corp.
- Jun Lang
- G01 - MEASURING TESTING
Information Patent Grant
Region based virtual fourier filter
- Patent number 8,989,479
- Issue date Mar 24, 2015
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 8,775,101
- Issue date Jul 8, 2014
- KLA-Tencor Corp.
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 8,467,047
- Issue date Jun 18, 2013
- KLA-Tencor Corp.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 8,223,327
- Issue date Jul 17, 2012
- KLA-Tencor Corp.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive signature detection
- Patent number 8,059,886
- Issue date Nov 15, 2011
- KLA-Tencor Corporation
- Yong Gao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES
- Publication number 20220245791
- Publication date Aug 4, 2022
- KLA Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES
- Publication number 20210049755
- Publication date Feb 18, 2021
- KLA Corporation
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEFECTS IN A LOGIC REGION ON A WAFER
- Publication number 20200090904
- Publication date Mar 19, 2020
- KLA Corporation
- Junqing Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nuisance Reduction Using Location-Based Attributes
- Publication number 20190050974
- Publication date Feb 14, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION USING DIFFERENCE IMAGES
- Publication number 20180342051
- Publication date Nov 29, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
- Publication number 20180202943
- Publication date Jul 19, 2018
- KLA-Tencor Corporation
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Defining Care Areas in Repeating Structures o...
- Publication number 20170286589
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Local Threshold and Color Filtering
- Publication number 20170287128
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Visual Feedback for Inspection Algorithms and Filters
- Publication number 20160210526
- Publication date Jul 21, 2016
- KLA-Tencor Corporation
- Hucheng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tuning Wafer Inspection Recipes Using Precise Defect Locations
- Publication number 20150062571
- Publication date Mar 5, 2015
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
Scratch Filter for Wafer Inspection
- Publication number 20150063677
- Publication date Mar 5, 2015
- KLA-Tencor Corporation
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Application
Adaptive Local Threshold and Color Filtering
- Publication number 20150043804
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer
- Publication number 20140270474
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Junqing Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer
- Publication number 20140185919
- Publication date Jul 3, 2014
- KLA-Tencor Corporation
- Jun Lang
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Detecting Defects on a Wafer
- Publication number 20130250287
- Publication date Sep 26, 2013
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEFECTS ON A WAFER
- Publication number 20130035876
- Publication date Feb 7, 2013
- KLA-Tencor Corporation
- Junqing Huang
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Detecting Defects on a Wafer
- Publication number 20120268735
- Publication date Oct 25, 2012
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
REGION BASED VIRTUAL FOURIER FILTER
- Publication number 20120141013
- Publication date Jun 7, 2012
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Signature Detection
- Publication number 20110170766
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Yong Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
- Publication number 20100188657
- Publication date Jul 29, 2010
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING

Junqing Huang

Person

Patents Grantslast 30 patents

Design-assisted inspection for DRAM and 3D NAND devices

Design-assisted inspection for DRAM and 3D NAND devices

Wafer inspection using difference images

Detecting defects in a logic region on a wafer

Systems and methods for detecting defects on a wafer

Nuisance reduction using location-based attributes

Visual feedback for inspection algorithms and filters

Adaptive local threshold and color filtering

System and method for defining care areas in repeating structures o...

Systems and methods for detecting defects on a wafer

Adaptive local threshold and color filtering

Detecting defects on wafers based on 2D scatter plots of values det...

Scratch filter for wafer inspection

Tuning wafer inspection recipes using precise defect locations

Detecting defects on a wafer

Region based virtual fourier filter

Detecting defects on a wafer

Systems and methods for detecting defects on a wafer

Systems and methods for detecting defects on a wafer

Adaptive signature detection

Patents Applicationslast 30 patents

DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES

DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES

DETECTING DEFECTS IN A LOGIC REGION ON A WAFER

Nuisance Reduction Using Location-Based Attributes

WAFER INSPECTION USING DIFFERENCE IMAGES

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER

System and Method for Defining Care Areas in Repeating Structures o...

Adaptive Local Threshold and Color Filtering

Visual Feedback for Inspection Algorithms and Filters

Tuning Wafer Inspection Recipes Using Precise Defect Locations

Scratch Filter for Wafer Inspection

Adaptive Local Threshold and Color Filtering

Detecting Defects on a Wafer

Detecting Defects on a Wafer

Systems and Methods for Detecting Defects on a Wafer

DETECTING DEFECTS ON A WAFER

Systems and Methods for Detecting Defects on a Wafer

REGION BASED VIRTUAL FOURIER FILTER

Adaptive Signature Detection

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER