Junseong Yoon

Follow

Person

Suwon-si, KR

People

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF DETERMINING OVERLAYER REFERENCE WAVELENGTH
- Publication number 20250189902
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Byeongseon PARK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...
- Publication number 20250012736
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Dohun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-WAVELENGTH SELECTION METHOD FOR OVERLAY MEASUREMENT, AND OVER...
- Publication number 20240134290
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inbeom Yim
- H01 - BASIC ELECTRIC ELEMENTS