Junsheng Chen

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Testability circuit and read and write path decoupling circuit of SRAM
- Patent number 12,260,924
- Issue date Mar 25, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for temperature stress test for memory chips
- Patent number 12,044,723
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Grant
Wafer acceptance test module and method for a static memory functio...
- Patent number 11,462,290
- Issue date Oct 4, 2022
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS
- Publication number 20240264222
- Publication date Aug 8, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Application
Design for Testability Circuit and Read and Write Path Decoupling C...
- Publication number 20230410928
- Publication date Dec 21, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G11 - INFORMATION STORAGE
Information Patent Application
DESIGN-FOR-TEST CIRCUIT FOR EVALUATING BIAS TEMPERATURE INSTABILITY...
- Publication number 20230079961
- Publication date Mar 16, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Application
Wafer Acceptance Test Module and Method for a Static Memory Functio...
- Publication number 20210134382
- Publication date May 6, 2021
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G11 - INFORMATION STORAGE