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Juntaro Arima
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning electron microscope
Patent number
8,666,165
Issue date
Mar 4, 2014
Hitachi, Ltd.
Satoru Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
System and method for on-line diagnostics
Patent number
7,849,304
Issue date
Dec 7, 2010
Hitachi High-Technologies Corporation
Juntaro Arima
G05 - CONTROLLING REGULATING
Information
Patent Grant
Industrial device receiving remote maintenance operation and output...
Patent number
7,551,976
Issue date
Jun 23, 2009
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope
Patent number
7,439,505
Issue date
Oct 21, 2008
Hitachi, Ltd.
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for on-line diagnostics
Patent number
7,373,501
Issue date
May 13, 2008
Hitachi High-Technologies Corporation
Juntaro Arima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Remote maintenance method for generating maintenance charge informa...
Patent number
7,177,715
Issue date
Feb 13, 2007
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Monitoring device and monitoring method for vacuum device
Patent number
7,117,127
Issue date
Oct 3, 2006
Hitachi, Ltd.
Hitoshi Fukube
G05 - CONTROLLING REGULATING
Information
Patent Grant
Semiconductor manufacturing apparatus and its diagnosis apparatus a...
Patent number
7,047,093
Issue date
May 16, 2006
Hitachi High-Technologies Corporation
Shigeru Nakamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Remote maintenance method, industrial device, and semiconductor device
Patent number
7,047,096
Issue date
May 16, 2006
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope
Patent number
7,002,151
Issue date
Feb 21, 2006
Hitachi, Ltd.
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Remote maintenance method for industrial device that generates main...
Patent number
6,954,677
Issue date
Oct 11, 2005
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Monitoring device and monitoring method for vacuum device
Patent number
6,925,423
Issue date
Aug 2, 2005
Hitachi, Ltd.
Hitoshi Fukube
G05 - CONTROLLING REGULATING
Information
Patent Grant
Semiconductor manufacturing apparatus and its diagnosis apparatus a...
Patent number
6,901,306
Issue date
May 31, 2005
Hitachi High-Technologies Corporation
Shigeru Nakamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Remote maintenance method, industrial device, and semiconductor device
Patent number
6,862,485
Issue date
Mar 1, 2005
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope
Patent number
6,803,573
Issue date
Oct 12, 2004
Hitachi, Ltd.
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Remote maintenance method, industrial device, and semiconductor device
Patent number
6,792,325
Issue date
Sep 14, 2004
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Remote maintenance method, industrial device, and semiconductor device
Patent number
6,708,072
Issue date
Mar 16, 2004
Hitachi, Ltd.
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope
Patent number
6,627,888
Issue date
Sep 30, 2003
Hitachi, Ltd.
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for improving the signal-to-noise ratio of image signals...
Patent number
4,912,328
Issue date
Mar 27, 1990
Hitachi, Ltd.
Makoto Kato
G01 - MEASURING TESTING
Information
Patent Grant
System of automatically measuring sectional shape
Patent number
4,725,730
Issue date
Feb 16, 1988
Hitachi, Ltd.
Makoto Kato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SERVER, CONTROL SYSTEM, CONTROL METHOD AND NON-TRANSITORY COMPUTER...
Publication number
20200035352
Publication date
Jan 30, 2020
Hitachi High-Technologies Corporation
Nobuhiro SEKIMOTO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SCANNING ELECTRON MICROSCOPE
Publication number
20090041333
Publication date
Feb 12, 2009
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR ON-LINE DIAGNOSTICS
Publication number
20080133032
Publication date
Jun 5, 2008
Juntaro Arima
G05 - CONTROLLING REGULATING
Information
Patent Application
System and method for on-line diagnostics
Publication number
20080005554
Publication date
Jan 3, 2008
Juntaro Arima
G05 - CONTROLLING REGULATING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20070112452
Publication date
May 17, 2007
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scanning electron microscope
Publication number
20060097158
Publication date
May 11, 2006
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Monitoring device and monitoring method for vacuum device
Publication number
20060004544
Publication date
Jan 5, 2006
Hitoshi Fukube
G05 - CONTROLLING REGULATING
Information
Patent Application
Scanning electron microscope
Publication number
20050109937
Publication date
May 26, 2005
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20050038546
Publication date
Feb 17, 2005
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20050038545
Publication date
Feb 17, 2005
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20050033465
Publication date
Feb 10, 2005
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor manufacturing apparatus and its diagnosis apparatus a...
Publication number
20040078946
Publication date
Apr 29, 2004
Shigeru Nakamoto
G05 - CONTROLLING REGULATING
Information
Patent Application
Scanning electron microscope
Publication number
20040016882
Publication date
Jan 29, 2004
Hitachi, Ltd,
Satoru Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for on-line diagnostics
Publication number
20030226010
Publication date
Dec 4, 2003
Juntaro Arima
G05 - CONTROLLING REGULATING
Information
Patent Application
Semiconductor manufacturing apparatus and its diagnosis apparatus a...
Publication number
20030163217
Publication date
Aug 28, 2003
Shigeru Nakamoto
G05 - CONTROLLING REGULATING
Information
Patent Application
Monitoring device and monitoring method for vacuum device
Publication number
20030063123
Publication date
Apr 3, 2003
Hitoshi Fukube
G05 - CONTROLLING REGULATING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20020183876
Publication date
Dec 5, 2002
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20020183875
Publication date
Dec 5, 2002
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Remote maintenance method, industrial device, and semiconductor device
Publication number
20020183880
Publication date
Dec 5, 2002
Juntaro Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scanning electron microscope
Publication number
20010019109
Publication date
Sep 6, 2001
Hitachi, Ltd.
Satoru Yamaguchi
G01 - MEASURING TESTING