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Juntaro Ishii
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Ibaraki, JP
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Patents Grants
last 30 patents
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Patent Grant
Method and system of measuring surface temperature
Patent number
9,689,746
Issue date
Jun 27, 2017
National Institute of Advanced Industrial Science and Technology
Yoshiro Yamada
G01 - MEASURING TESTING
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Patent Grant
Electrode member, electron energy analyzer, photoelectron energy an...
Patent number
8,944,679
Issue date
Feb 3, 2015
National Institute of Advanced Industrial Science and Technology
Juntaro Ishii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND SYSTEM OF MEASURING SURFACE TEMPERATURE
Publication number
20130294480
Publication date
Nov 7, 2013
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Yoshiro Yamada
G01 - MEASURING TESTING
Information
Patent Application
ELECTRODE MEMBER, ELECTRON ENERGY ANALYZER, PHOTOELECTRON ENERGY AN...
Publication number
20120155509
Publication date
Jun 21, 2012
Juntaro Ishii
G01 - MEASURING TESTING