Junzo AZUMA

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Minato-ku, Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder and charged particle beam apparatus
- Patent number 12,198,892
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Shigeru Haneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section observation device, and control method
- Patent number 11,600,463
- Issue date Mar 7, 2023
- Hitachi High-Tech Science Corporation
- Xin Man
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Sample Holder and Charged Particle Beam Apparatus
- Publication number 20220277923
- Publication date Sep 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Shigeru HANEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION OBSERVATION DEVICE, AND CONTROL METHOD
- Publication number 20200111639
- Publication date Apr 9, 2020
- Hitachi High-Tech Science Corporation
- XIN MAN
- G06 - COMPUTING CALCULATING COUNTING