Junzo Azuma

Person

Hitachiohta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle radiation apparatus, and method for displaying thr...
- Patent number 9,099,281
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Specified position identifying method and specified position measur...
- Patent number 8,442,300
- Issue date May 14, 2013
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus using an electrostatic lens gun
- Patent number 8,399,863
- Issue date Mar 19, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 7,301,146
- Issue date Nov 27, 2007
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting defects of devices and method of inspectin...
- Patent number 6,970,004
- Issue date Nov 29, 2005
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 6,960,765
- Issue date Nov 1, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting defect in device and method of detecting de...
- Patent number 6,734,687
- Issue date May 11, 2004
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Radiation Apparatus, and Method for Displaying Thr...
- Publication number 20120212583
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE GUN AND FOCUSED ION BEAM APPARATUS USING THE GUN
- Publication number 20110186745
- Publication date Aug 4, 2011
- Hiroyasu Kqaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specified position identifying method and specified position measur...
- Publication number 20070274593
- Publication date Nov 29, 2007
- Ruriko Tsuneta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20050269511
- Publication date Dec 8, 2005
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspecting defects of devices and method of inspectin...
- Publication number 20040178811
- Publication date Sep 16, 2004
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20030184332
- Publication date Oct 2, 2003
- Satoshi Tomimatsu
- G01 - MEASURING TESTING

Junzo Azuma

Person

Patents Grantslast 30 patents

Charged particle radiation apparatus, and method for displaying thr...

Specified position identifying method and specified position measur...

Charged particle beam apparatus using an electrostatic lens gun

Probe driving method, and probe apparatus

Apparatus for inspecting defects of devices and method of inspectin...

Probe driving method, and probe apparatus

Apparatus for detecting defect in device and method of detecting de...

Patents Applicationslast 30 patents

Charged Particle Radiation Apparatus, and Method for Displaying Thr...

CHARGED PARTICLE GUN AND FOCUSED ION BEAM APPARATUS USING THE GUN

Specified position identifying method and specified position measur...

Probe driving method, and probe apparatus

Apparatus for inspecting defects of devices and method of inspectin...

Probe driving method, and probe apparatus