Junzo Yamada

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,567,760
- Issue date May 20, 2003
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,507,014
- Issue date Jan 14, 2003
- Ando Electric Co. Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe and measuring method using the same
- Patent number 6,469,528
- Issue date Oct 22, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe and a method for adjusting the same
- Patent number 6,445,198
- Issue date Sep 3, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,410,906
- Issue date Jun 25, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electro-optic sampling oscilloscope
- Patent number 6,407,561
- Issue date Jun 18, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe comprising photodiodes insulated from...
- Patent number 6,403,946
- Issue date Jun 11, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling prober
- Patent number 6,388,454
- Issue date May 14, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving circuit for use in electro-optic sampling oscilloscope
- Patent number 6,384,590
- Issue date May 7, 2002
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical probe for oscilloscope measuring signal waveform
- Patent number 6,369,562
- Issue date Apr 9, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,348,787
- Issue date Feb 19, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe
- Patent number 6,347,005
- Issue date Feb 12, 2002
- Ando Electric Co., Ltd.
- Noriyuki Toriyama
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,342,783
- Issue date Jan 29, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,337,565
- Issue date Jan 8, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe having unit for adjusting quantity of...
- Patent number 6,297,651
- Issue date Oct 2, 2001
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,297,650
- Issue date Oct 2, 2001
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electro-optic sampling oscilloscope
- Patent number 6,288,531
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for an electro-optic oscilloscope
- Patent number 6,288,529
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical oscilloscope with improved sampling
- Patent number 6,232,765
- Issue date May 15, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,201,235
- Issue date Mar 13, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,166,845
- Issue date Dec 26, 2000
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing circuit for electro-optic probe
- Patent number 6,087,838
- Issue date Jul 11, 2000
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
CMOS logic circuits having low and high-threshold voltage transistors
- Patent number 5,486,774
- Issue date Jan 23, 1996
- Nippon Telegraph & Telephone Corporation
- Takakuni Douseki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory having test circuit and test method thereof
- Patent number 5,400,342
- Issue date Mar 21, 1995
- Nippon Telegraph & Telephone Corporation
- Tsuneo Matsumura
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device employing multilevel storage circuits
- Patent number 4,771,404
- Issue date Sep 13, 1988
- Nippon Telegraph & Telephone Corporation
- Tsuneo Mano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory having self correction function
- Patent number 4,747,080
- Issue date May 24, 1988
- Nippon Telegraph & Telephone Corporation
- Junzo Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory
- Patent number 4,694,428
- Issue date Sep 15, 1987
- Nippon Telegraph & Telephone Corporation
- Tsuneo Matsumura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices
- Patent number 4,460,998
- Issue date Jul 17, 1984
- Nippon Telegraph & Telephone Public Corporation
- Junzo Yamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device
- Patent number 4,456,980
- Issue date Jun 26, 1984
- Nippon Telegraph & Telephone Public Corporation
- Junzo Yamada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Electro-optic probe
- Publication number 20020092975
- Publication date Jul 18, 2002
- AKISHIGE ITO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME
- Publication number 20020030500
- Publication date Mar 14, 2002
- FUMIO AKIKUNI
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic sampling probe
- Publication number 20020017913
- Publication date Feb 14, 2002
- Toshiyuki Yagi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM
- Publication number 20020011830
- Publication date Jan 31, 2002
- AKISHIGE ITO
- G01 - MEASURING TESTING

Junzo Yamada

Person

Patents Grantslast 30 patents

Electro-optic sampling oscilloscope

Electro-optic probe

Electro-optic sampling probe and measuring method using the same

Electro-optic sampling probe and a method for adjusting the same

Electro-optic probe

Probe for electro-optic sampling oscilloscope

Electro-optic sampling probe comprising photodiodes insulated from...

Electro-optic sampling prober

Light receiving circuit for use in electro-optic sampling oscilloscope

Electro-optical probe for oscilloscope measuring signal waveform

Electrooptic probe

Electro-optic sampling probe

Electrooptic probe

Electro-optic probe

Electro-optic sampling probe having unit for adjusting quantity of...

Electrooptic probe

Probe for electro-optic sampling oscilloscope

Timing generation circuit for an electro-optic oscilloscope

Electro-optical oscilloscope with improved sampling

Electro-optic sampling oscilloscope

Electro-optic probe

Signal processing circuit for electro-optic probe

CMOS logic circuits having low and high-threshold voltage transistors

Semiconductor memory having test circuit and test method thereof

Memory device employing multilevel storage circuits

Semiconductor memory having self correction function

Semiconductor memory

Semiconductor memory devices

Semiconductor memory device

Patents Applicationslast 30 patents

Electro-optic probe

ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME

Electro-optic sampling probe

ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM