Jurgen Thiel

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D-52074 Aachen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Angle measuring system
- Patent number 6,995,836
- Issue date Feb 7, 2006
- Dr. Johannes Heidenhain GmbH
- Sebastian Tondorf
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device with a beam splitter
- Patent number 6,535,290
- Issue date Mar 18, 2003
- Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system and method for operating a position measu...
- Patent number 6,265,992
- Issue date Jul 24, 2001
- Dr. Johannes Heidenhain GmbH
- Rainer Hagl
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system and method for operating a position measu...
- Patent number 6,097,318
- Issue date Aug 1, 2000
- Dr. Johannes Heidenhain GmbH
- Rainer Hagl
- G01 - MEASURING TESTING
Information Patent Grant
Absolute interferometer measuring process and apparatus having a me...
- Patent number 5,631,736
- Issue date May 20, 1997
- Dr. Johannes Heidenhain GmbH
- Jurgen Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and method for controlling the activation of...
- Patent number 5,596,410
- Issue date Jan 21, 1997
- Peter Hantel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring absolute measurements having two...
- Patent number 5,521,704
- Issue date May 28, 1996
- Jurgen Thiel
- G01 - MEASURING TESTING