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Jurgen Vierling
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D-6904 Eppelheim, DE
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last 30 patents
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Patent Grant
Microtome
Patent number
6,598,507
Issue date
Jul 29, 2003
Leica Microsystems Nussloch GmbH
Bernd Günther
G01 - MEASURING TESTING
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Patent Grant
Microtomy device
Patent number
4,979,376
Issue date
Dec 25, 1990
Manfred Biehl
G01 - MEASURING TESTING