Juri Barthel

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Aachen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and a method for measuring the defocus variatio...
- Patent number 9,076,630
- Issue date Jul 7, 2015
- Forschungszentrum Juelich GmbH
- Andreas Thust
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and electron microscope for measuring the similarity of two-...
- Patent number 8,351,710
- Issue date Jan 8, 2013
- Forschungszentrum Juelich GmbH
- Andreas Thust
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE AND A METHOD FOR MEASURING THE DEFOCUS VARIATIO...
- Publication number 20100032565
- Publication date Feb 11, 2010
- Andreas Thust
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND ELECTRON MICROSCOPE FOR MEASURING THE SIMILARITY OF TWO-...
- Publication number 20090268969
- Publication date Oct 29, 2009
- FORSCHUNGSZENTRUM JUELICH GMBH
- Andreas Thust
- G06 - COMPUTING CALCULATING COUNTING