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Juri Vinshtein
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Hadera, IL
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last 30 patents
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Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
Publication number
20190339215
Publication date
Nov 7, 2019
BRUKER JV ISRAEL LTD.
Alex Krokhmal
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
Publication number
20170199136
Publication date
Jul 13, 2017
BRUKER JV ISRAEL LTD.
Alex Krokhmal
G01 - MEASURING TESTING