Jurren H. Walters

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Tunable Fabry-Perot interferometer and X-ray display device having...
- Patent number 4,547,801
- Issue date Oct 15, 1985
- U.S. Philips Corporation
- Jan Haisma
- G01 - MEASURING TESTING