Justin Dianhuan Liou

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
193nm laser and inspection system
- Patent number 10,439,355
- Issue date Oct 8, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 10,193,293
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Laser repetition rate multiplier and flat-top beam profile generato...
- Patent number 10,044,164
- Issue date Aug 7, 2018
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High brightness laser-sustained plasma broadband source
- Patent number 10,032,619
- Issue date Jul 24, 2018
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,972,959
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,935,421
- Issue date Apr 3, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
High brightness laser-sustained plasma broadband source
- Patent number 9,865,447
- Issue date Jan 9, 2018
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,793,673
- Issue date Oct 17, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,768,577
- Issue date Sep 19, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
193 nm laser and an inspection system using a 193 nm laser
- Patent number 9,608,399
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,529,182
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Laser repetition rate multiplier and flat-top beam profile generato...
- Patent number 9,525,265
- Issue date Dec 20, 2016
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,151,940
- Issue date Oct 6, 2015
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20180233872
- Publication date Aug 16, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
High Brightness Laser-Sustained Plasma Broadband Source
- Publication number 20180114687
- Publication date Apr 26, 2018
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Brightness Laser-Sustained Plasma Broadband Source
- Publication number 20170278694
- Publication date Sep 28, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
193nm Laser And Inspection System
- Publication number 20170063026
- Publication date Mar 2, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...
- Publication number 20160359292
- Publication date Dec 8, 2016
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20160285223
- Publication date Sep 29, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
193nm Laser And An Inspection System Using A 193nm Laser
- Publication number 20160056606
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...
- Publication number 20150372446
- Publication date Dec 24, 2015
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20150364895
- Publication date Dec 17, 2015
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
193nm Laser And Inspection System
- Publication number 20140226140
- Publication date Aug 14, 2014
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20140153596
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20120314286
- Publication date Dec 13, 2012
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS

Justin Dianhuan Liou

Person

Patents Grantslast 30 patents

193nm laser and inspection system

Semiconductor inspection and metrology system using laser pulse mul...

Laser repetition rate multiplier and flat-top beam profile generato...

High brightness laser-sustained plasma broadband source

Semiconductor inspection and metrology system using laser pulse mul...

193nm laser and inspection system

High brightness laser-sustained plasma broadband source

Semiconductor inspection and metrology system using laser pulse mul...

Semiconductor inspection and metrology system using laser pulse mul...

193 nm laser and an inspection system using a 193 nm laser

193nm laser and inspection system

Laser repetition rate multiplier and flat-top beam profile generato...

Semiconductor inspection and metrology system using laser pulse mul...

Patents Applicationslast 30 patents

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

High Brightness Laser-Sustained Plasma Broadband Source

High Brightness Laser-Sustained Plasma Broadband Source

193nm Laser And Inspection System

Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

193nm Laser And An Inspection System Using A 193nm Laser

Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

193nm Laser And Inspection System

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...