Justin Dougherty

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Dual gate metal-oxide-semiconductor field-effect transistor
- Patent number 10,586,865
- Issue date Mar 10, 2020
- Cirrus Logic, Inc.
- Scott Warrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random telegraph signal identification and measurement
- Patent number 9,723,578
- Issue date Aug 1, 2017
- Cirrus Logic, Inc.
- John L. Melanson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Power amplifier having an integrated microcontroller
- Patent number 9,450,552
- Issue date Sep 20, 2016
- Avago Technologies General IP (Singapore) Pte. Ltd.
- Timothy Dupuis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test socket with integral inductor and method of manufacturing usin...
- Patent number 6,909,298
- Issue date Jun 21, 2005
- Silicon Laboratories, Inc.
- Martin J. Gabriel, III
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DUAL GATE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR
- Publication number 20190103490
- Publication date Apr 4, 2019
- Cirrus Logic International Semiconductor Ltd.
- Scott WARRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RANDOM TELEGRAPH SIGNAL IDENTIFICATION AND MEASUREMENT
- Publication number 20160366656
- Publication date Dec 15, 2016
- Cirrus Logic International Semiconductor Ltd.
- John L. MELANSON
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Power Amplifier Having An Integrated Microcontroller
- Publication number 20140100002
- Publication date Apr 10, 2014
- Avago Technologies General IP (Singapore) PTE. LTD.
- Timothy Dupuis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Variable inductance test socket and method of manufacturing using s...
- Publication number 20040196059
- Publication date Oct 7, 2004
- Martin J. Gabriel
- G01 - MEASURING TESTING