Justin E. Patterson

Person

Honolulu, HI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Swept parameter oscilloscope
- Patent number 12,085,590
- Issue date Sep 10, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING
- Publication number 20250004015
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
GENERATING TEST DATA USING PRINCIPAL COMPONENT ANALYSIS
- Publication number 20230409451
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Justin E. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER
- Publication number 20230408551
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Justin E. Patterson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MACHINE LEARNING MODEL TRAINING AND DEPLOYMENT
- Publication number 20230222382
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Wenzheng Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIGITAL TWIN WITH MACHINE LEARNING WAVEFORM GENERATION INCLUDING PA...
- Publication number 20230057479
- Publication date Feb 23, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SWEPT PARAMETER OSCILLOSCOPE
- Publication number 20230019734
- Publication date Jan 19, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...
- Publication number 20220390515
- Publication date Dec 8, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING

Justin E. Patterson

Person

Patents Grantslast 30 patents

Swept parameter oscilloscope

Patents Applicationslast 30 patents

INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING

GENERATING TEST DATA USING PRINCIPAL COMPONENT ANALYSIS

OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER

SYSTEMS AND METHODS FOR MACHINE LEARNING MODEL TRAINING AND DEPLOYMENT

DIGITAL TWIN WITH MACHINE LEARNING WAVEFORM GENERATION INCLUDING PA...

SWEPT PARAMETER OSCILLOSCOPE

GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...