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Justin Hwu
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San Jose, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Method for pattern recognition in energized charge particle beam wa...
Patent number
7,129,484
Issue date
Oct 31, 2006
Hitachi Global Storage Technologies Netherlands B.V.
Justin Hwu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Reference feature design for flare location monitor in perpendicula...
Publication number
20070113395
Publication date
May 24, 2007
HITACHI GLOBAL STORAGE TECHNOLOGIES
Sukhbir Singh Dulay
G11 - INFORMATION STORAGE
Information
Patent Application
Method for determining material interfacial and metrology informati...
Publication number
20060289749
Publication date
Dec 28, 2006
HITACHI GLOBAL STORAGE TECHNOLOGIES
Justin Jai-Jen Hwu
G01 - MEASURING TESTING
Information
Patent Application
Method and system for determining dimensions of a structure having...
Publication number
20060126915
Publication date
Jun 15, 2006
Justin Jia-Jen Hwu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of fabricating thin film calibration features for electron/i...
Publication number
20060073618
Publication date
Apr 6, 2006
Sukhbir Singh Dulay
G11 - INFORMATION STORAGE
Information
Patent Application
Method for pattern recognition in energized charge particle beam wa...
Publication number
20050157918
Publication date
Jul 21, 2005
Hitachi Global Storage Technologies
Justin Hwu
G01 - MEASURING TESTING