Justin Lach

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Portage, MI, US

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Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DE...
- Publication number 20230236132
- Publication date Jul 27, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
IMAGING REFLECTOMETRY FOR INLINE SCREENING
- Publication number 20220307990
- Publication date Sep 29, 2022
- John Charles Robinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST...
- Publication number 20220196723
- Publication date Jun 23, 2022
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS