Justin Lloyd KREUZER

Person

Trumbull, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrometric metrology systems based on multimode interference and...
- Patent number 12,135,505
- Issue date Nov 5, 2024
- ASML Holding N.V.
- Mohamed Swillam
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Overlay measurement system using lock-in amplifier technique
- Patent number 12,124,177
- Issue date Oct 22, 2024
- ASML Holding N.V.
- Mohamed Swillam
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus, metrology systems, phased array illuminatio...
- Patent number 11,994,808
- Issue date May 28, 2024
- ASML Holding N.V.
- Mohamed Swillam
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic apparatus, metrology systems, phased array illuminatio...
- Patent number 11,966,169
- Issue date Apr 23, 2024
- ASML Holding N.V.
- Mohamed Swillam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of sensing alignment marks
- Patent number 11,841,628
- Issue date Dec 12, 2023
- ASML Holding N.V.
- Krishanu Shome
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical arrangement for an inspection apparatus
- Patent number 11,662,198
- Issue date May 30, 2023
- ASML Holding N.V.
- Parag Vinayak Kelkar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Compact alignment sensor arrangements
- Patent number 11,531,280
- Issue date Dec 20, 2022
- ASML Holding N.V.
- Tamer Mohamed Tawfik Ahmed Mohamed Elazhary
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sensor apparatus and method for lithographic measurements
- Patent number 11,526,091
- Issue date Dec 13, 2022
- ASML Holding N.V.
- Tamer Mohamed Tawfik Ahmed Mohamed Elazhary
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment sensor apparatus for process sensitivity compensation
- Patent number 11,175,593
- Issue date Nov 16, 2021
- ASML Netherlands B.V.
- Simon Reinald Huisman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology tool and method of using the same
- Patent number 10,908,516
- Issue date Feb 2, 2021
- ASML Holding N.V.
- Justin Lloyd Kreuzer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical system of an alignment system
- Patent number 10,732,524
- Issue date Aug 4, 2020
- ASML Holding N.V.
- Krishanu Shome
- G02 - OPTICS
Information Patent Grant
Polarization independent metrology system
- Patent number 10,558,131
- Issue date Feb 11, 2020
- ASML Holding N.V.
- Krishanu Shome
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment system wafer stack beam analyzer
- Patent number 10,488,767
- Issue date Nov 26, 2019
- ASML Holding N.V.
- Krishanu Shome
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Polarization independent metrology system
- Patent number 10,338,481
- Issue date Jul 2, 2019
- ASML Holding N.V.
- Krishanu Shome
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position measurement with illumination profile having two diametric...
- Patent number 9,970,747
- Issue date May 15, 2018
- ASML Netherlands B.V.
- Justin Lloyd Kreuzer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Polarization independent interferometer
- Patent number 9,927,726
- Issue date Mar 27, 2018
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment sensor and lithographic apparatus
- Patent number 9,857,703
- Issue date Jan 2, 2018
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position measurement with illumination profile having regions confi...
- Patent number 9,605,947
- Issue date Mar 28, 2017
- ASML Holding N.V.
- Justin Lloyd Kreuzer
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Mark position measuring apparatus and method, lithographic apparatu...
- Patent number 9,551,939
- Issue date Jan 24, 2017
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position measuring apparatus, position measuring method, lithograph...
- Patent number 9,506,743
- Issue date Nov 29, 2016
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 8,089,609
- Issue date Jan 3, 2012
- ASML Holding N.V.
- Harry Sewell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Using an interferometer as a high speed variable attenuator
- Patent number 7,898,646
- Issue date Mar 1, 2011
- ASML Netherlands B.V.
- Oscar Franciscus Jozephus Noordman
- G02 - OPTICS
Information Patent Grant
Methods and systems to compensate for a stitching disturbance of a...
- Patent number 7,773,199
- Issue date Aug 10, 2010
- ASML Holding N.V.
- Arno Bleeker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical element damping systems
- Patent number 7,751,130
- Issue date Jul 6, 2010
- ASML Holding N.V.
- Stephen Roux
- G02 - OPTICS
Information Patent Grant
Interferometric lithographic projection apparatus
- Patent number 7,751,030
- Issue date Jul 6, 2010
- ASML Holding N.V.
- Louis Markoya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Using an interferometer as a high speed variable attenuator
- Patent number 7,683,300
- Issue date Mar 23, 2010
- ASML Netherlands B.V.
- Oscar Franciscus Jozephus Noordman
- G02 - OPTICS
Information Patent Grant
Methods and systems to compensate for a stitching disturbance of a...
- Patent number 7,630,054
- Issue date Dec 8, 2009
- ASML Holding N.V.
- Arno Bleeker
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Layered structure for a tile wave plate assembly
- Patent number 7,548,370
- Issue date Jun 16, 2009
- ASML Holding N.V.
- Michael M. Albert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Symmetrical illumination forming system and method
- Patent number 7,511,826
- Issue date Mar 31, 2009
- ASML Holding N.V.
- Justin L. Kreuzer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic printing with polarized light
- Patent number 7,445,883
- Issue date Nov 4, 2008
- ASML Holding N.V.
- Nabila Baba-Ali
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM FOR RETICLE PARTICLE DETECTION USING A STRUCTURAL...
- Publication number 20240272058
- Publication date Aug 15, 2024
- ASML NETHERLANDS B.V.
- Michal Emanuel PAWLOWSKI
- G01 - MEASURING TESTING
Information Patent Application
INTENSITY ORDER DIFFERENCE BASED METROLOGY SYSTEM, LITHOGRAPHIC APP...
- Publication number 20240094641
- Publication date Mar 21, 2024
- ASML Holding N.V.
- Justin Lloyd KREUZER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING INTENSITY IN A LITHOGRAPHIC ALIGN...
- Publication number 20240077308
- Publication date Mar 7, 2024
- ASML Holding N.V.
- Mohamed SWILLAM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY SYSTEM AND COHERENCE ADJUSTERS
- Publication number 20240027913
- Publication date Jan 25, 2024
- ASML NETHERLANDS B.V.
- Sergei SOKOLOV
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SPECTROMETRIC METROLOGY SYSTEMS BASED ON MULTIMODE INTERFERENCE AND...
- Publication number 20230273531
- Publication date Aug 31, 2023
- ASML Holding N.V.
- Mohamed SWILLAM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SELF-REFERENCING INTEGRATED ALIGNMENT SENSOR
- Publication number 20230266681
- Publication date Aug 24, 2023
- ASML Holding N.V.
- Mohamed SWILLAM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MONOLITHIC PARTICLE INSPECTION DEVICE
- Publication number 20230266255
- Publication date Aug 24, 2023
- ASML NETHERLANDS B.V.
- Ilse VAN WEPEREN
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS...
- Publication number 20230142459
- Publication date May 11, 2023
- ASML Holding N.V.
- Andrew JUDGE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR AND METHOD OF SENSING ALIGNMENT MARKS
- Publication number 20230116318
- Publication date Apr 13, 2023
- ASML Holding N.V.
- Krishanu SHOME
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR REGION OF INTEREST PROCESSING FOR RETICLE PARTICLE DETEC...
- Publication number 20230055116
- Publication date Feb 23, 2023
- ASML Holding N.V.
- Peter Conrad KOCHERSPERGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OVERLAY MEASUREMENT SYSTEM USING LOCK-IN AMPLIFIER TECHNIQUE
- Publication number 20230008139
- Publication date Jan 12, 2023
- ASML Holding N.V.
- Mohamed SWILLAM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A METHOD FOR FILTERING AN IMAGE AND ASSOCIATED METROLOGY APPARATUS
- Publication number 20220350260
- Publication date Nov 3, 2022
- ASML Holding N.V.
- Armand Eugene Albert
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM AND METHOD
- Publication number 20220283515
- Publication date Sep 8, 2022
- ASML Holding N.V.
- Tamer Mohamed Tawfik Ahmed Mohamed ELAZHARY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SENSOR APPARATUS AND METHOD FOR LITHOGRAPHIC MEASUREMENTS
- Publication number 20220179331
- Publication date Jun 9, 2022
- ASML Holding N.V.
- Tamer Mohamed Tawfik Ahmed Mohamed ELAZHARY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS FOR AND METHOD OF SIMULTANEOUSLY ACQUIRING PARALLEL ALIGN...
- Publication number 20220100109
- Publication date Mar 31, 2022
- ASML Holding N.V.
- Tamer Mohamed Tawfik Ahmed Mohamed ELAZHARY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPACT ALIGNMENT SENSOR ARRANGEMENTS
- Publication number 20210318627
- Publication date Oct 14, 2021
- ASML Holding N.V.
- Tamer Mohamed Tawfik Ahmed Mohamed ELAZHARY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Sensor Apparatus for Process Sensivity Compensation
- Publication number 20210132509
- Publication date May 6, 2021
- ASML NETHERLANDS B.V.
- Simon Reinald HUISMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus, Metrology Systems, Phased Array Illuminatio...
- Publication number 20210095957
- Publication date Apr 1, 2021
- ASML Holding N.V.
- Mohamed SWILLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Arrangement for an Inspection Apparatus
- Publication number 20200271438
- Publication date Aug 27, 2020
- ASML Holding N.V.
- Parag Vinayak KELKAR
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TOOL AND METHOD OF USING THE SAME
- Publication number 20200064746
- Publication date Feb 27, 2020
- ASML Holding N.V.
- Justin Lloyd KREUZER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Polarization Independent Metrology System
- Publication number 20190243254
- Publication date Aug 8, 2019
- ASML Holding N.V.
- Krishanu Shome
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment System Wafer Stack Beam Analyzer
- Publication number 20190204759
- Publication date Jul 4, 2019
- ASML Holding N.V.
- Krishanu SHOME
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POLARIZATION INDEPENDENT METROLOGY SYSTEM
- Publication number 20180299790
- Publication date Oct 18, 2018
- ASML Holding N.V.
- Krishanu SHOME
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical System of an Alignment System
- Publication number 20180224759
- Publication date Aug 9, 2018
- ASML Holding N.V.
- Krishanu SHOME
- G02 - OPTICS
Information Patent Application
Alignment Sensor and Lithographic Apparatus
- Publication number 20170212434
- Publication date Jul 27, 2017
- ASML NETHERLANDS B.V.
- Simon Gijsbert Josephus MATHIJSSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Position Measurement with Illumination Profile having Regions Confi...
- Publication number 20170160075
- Publication date Jun 8, 2017
- ASML NETHERLANDS B.V.
- Justin Lloyd KREUZER
- G01 - MEASURING TESTING
Information Patent Application
Polarization Independent Interferometer
- Publication number 20160223920
- Publication date Aug 4, 2016
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
MARK POSITION MEASURING APPARATUS AND METHOD, LITHOGRAPHIC APPARATU...
- Publication number 20150234290
- Publication date Aug 20, 2015
- ASML NETHERLANDS B.V.
- Simon Gijsbert Josephus Mathijssen
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASURING APPARATUS, POSITION MEASURING METHOD, LITHOGRAPH...
- Publication number 20150219438
- Publication date Aug 6, 2015
- ASML NETHERLANDS B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Application
Position Measuring Method, Position Measuring Apparatus, Lithograph...
- Publication number 20150109624
- Publication date Apr 23, 2015
- ASML NETHERLANDS B.V.
- Justin Lloyd Kreuzer
- G01 - MEASURING TESTING

Justin Lloyd KREUZER

Person

Patents Grantslast 30 patents

Spectrometric metrology systems based on multimode interference and...

Overlay measurement system using lock-in amplifier technique

Lithographic apparatus, metrology systems, phased array illuminatio...

Lithographic apparatus, metrology systems, phased array illuminatio...

Apparatus for and method of sensing alignment marks

Optical arrangement for an inspection apparatus

Compact alignment sensor arrangements

Sensor apparatus and method for lithographic measurements

Alignment sensor apparatus for process sensitivity compensation

Metrology tool and method of using the same

Optical system of an alignment system

Polarization independent metrology system

Alignment system wafer stack beam analyzer

Polarization independent metrology system

Position measurement with illumination profile having two diametric...

Polarization independent interferometer

Alignment sensor and lithographic apparatus

Position measurement with illumination profile having regions confi...

Mark position measuring apparatus and method, lithographic apparatu...

Position measuring apparatus, position measuring method, lithograph...

Lithographic apparatus and device manufacturing method

Using an interferometer as a high speed variable attenuator

Methods and systems to compensate for a stitching disturbance of a...

Optical element damping systems

Interferometric lithographic projection apparatus

Using an interferometer as a high speed variable attenuator

Methods and systems to compensate for a stitching disturbance of a...

Layered structure for a tile wave plate assembly

Symmetrical illumination forming system and method

Lithographic printing with polarized light

Patents Applicationslast 30 patents

INSPECTION SYSTEM FOR RETICLE PARTICLE DETECTION USING A STRUCTURAL...

INTENSITY ORDER DIFFERENCE BASED METROLOGY SYSTEM, LITHOGRAPHIC APP...

SYSTEMS AND METHODS FOR MEASURING INTENSITY IN A LITHOGRAPHIC ALIGN...

METROLOGY SYSTEM AND COHERENCE ADJUSTERS

SPECTROMETRIC METROLOGY SYSTEMS BASED ON MULTIMODE INTERFERENCE AND...

SELF-REFERENCING INTEGRATED ALIGNMENT SENSOR

MONOLITHIC PARTICLE INSPECTION DEVICE

CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS...

APPARATUS FOR AND METHOD OF SENSING ALIGNMENT MARKS

METHOD FOR REGION OF INTEREST PROCESSING FOR RETICLE PARTICLE DETEC...

OVERLAY MEASUREMENT SYSTEM USING LOCK-IN AMPLIFIER TECHNIQUE

A METHOD FOR FILTERING AN IMAGE AND ASSOCIATED METROLOGY APPARATUS

METROLOGY SYSTEM AND METHOD

SENSOR APPARATUS AND METHOD FOR LITHOGRAPHIC MEASUREMENTS

APPARATUS FOR AND METHOD OF SIMULTANEOUSLY ACQUIRING PARALLEL ALIGN...

COMPACT ALIGNMENT SENSOR ARRANGEMENTS

Alignment Sensor Apparatus for Process Sensivity Compensation

Lithographic Apparatus, Metrology Systems, Phased Array Illuminatio...

Optical Arrangement for an Inspection Apparatus

METROLOGY TOOL AND METHOD OF USING THE SAME

Polarization Independent Metrology System

Alignment System Wafer Stack Beam Analyzer

POLARIZATION INDEPENDENT METROLOGY SYSTEM

Optical System of an Alignment System

Alignment Sensor and Lithographic Apparatus

Position Measurement with Illumination Profile having Regions Confi...

Polarization Independent Interferometer

MARK POSITION MEASURING APPARATUS AND METHOD, LITHOGRAPHIC APPARATU...

POSITION MEASURING APPARATUS, POSITION MEASURING METHOD, LITHOGRAPH...

Position Measuring Method, Position Measuring Apparatus, Lithograph...