Justin Schauer

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Hardware implementation of the filter/project operations
- Patent number 9,727,606
- Issue date Aug 8, 2017
- Oracle International Corporation
- Justin Schauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardware implementation of the aggregation/group by operation: filt...
- Patent number 9,600,522
- Issue date Mar 21, 2017
- Oracle International Corporation
- Justin Schauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardware implementation of the aggregation/group by operation: hash...
- Patent number 9,563,658
- Issue date Feb 7, 2017
- Oracle International Corporation
- Philip Amberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Offset cancellation for DC isolated nodes
- Patent number 8,818,271
- Issue date Aug 26, 2014
- Oracle International Corporation
- Justin M. Schauer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Offset cancellation for DC isolated nodes
- Patent number 8,644,759
- Issue date Feb 4, 2014
- Oracle America, Inc.
- Justin M. Schauer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Voltage margin testing for proximity communication
- Patent number 7,979,754
- Issue date Jul 12, 2011
- Oracle America, Inc.
- Robert J. Drost
- G01 - MEASURING TESTING
Information Patent Grant
Determining chip separation by comparing coupling capacitances
- Patent number 7,871,833
- Issue date Jan 18, 2011
- Oracle America, Inc.
- Alex Chow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for biasing a floating node in an integrated c...
- Patent number 7,750,709
- Issue date Jul 6, 2010
- Oracle America, Inc.
- Justin M. Schauer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Determining chip separation by comparing coupling capacitances
- Patent number 7,649,255
- Issue date Jan 19, 2010
- Sun Microsystems, Inc.
- Alex Chow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for high-throughput asynchronous communication...
- Patent number 7,636,361
- Issue date Dec 22, 2009
- Sun Microsystems, Inc.
- Jo C. Ebergen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring chip-to-chip capacitance differentials by demodulating si...
- Patent number 7,425,836
- Issue date Sep 16, 2008
- Sun Microsystems, Inc.
- Alex Chow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OFFSET CANCELLATION FOR DC ISOLATED NODES
- Publication number 20140099892
- Publication date Apr 10, 2014
- Oracle International Corporation
- Justin M. Schauer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HARDWARE IMPLEMENTATION OF THE FILTER/PROJECT OPERATIONS
- Publication number 20140052743
- Publication date Feb 20, 2014
- Justin Schauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HARDWARE IMPLEMENTATION OF THE AGGREGATION/GROUP BY OPERATION: HASH...
- Publication number 20140052726
- Publication date Feb 20, 2014
- Philip Amberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HARDWARE IMPLEMENTATION OF THE AGGREGATION/GROUP BY OPERATION: FILT...
- Publication number 20140052713
- Publication date Feb 20, 2014
- Justin Schauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OFFSET CANCELLATION FOR DC ISOLATED NODES
- Publication number 20100171554
- Publication date Jul 8, 2010
- SUN MICROSYSTEMS, INC.
- Justin M. Schauer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DETERMINING CHIP SEPARATION BY COMPARING COUPLING CAPACITANCES
- Publication number 20100060299
- Publication date Mar 11, 2010
- SUN MICROSYSTEMS, INC.
- Alex Chow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE MARGIN TESTING FOR PROXIMITY COMMUNICATION
- Publication number 20090193295
- Publication date Jul 30, 2009
- SUN MICROSYSTEMS, INC.
- Robert J. Drost
- G01 - MEASURING TESTING
Information Patent Application
Determining chip separation by comparing coupling capacitances
- Publication number 20080136424
- Publication date Jun 12, 2008
- Alex Chow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring chip-to-chip capacitance differentials by demodulating si...
- Publication number 20080061801
- Publication date Mar 13, 2008
- Alex Chow
- G01 - MEASURING TESTING

Justin Schauer

Person

Patents Grantslast 30 patents

Hardware implementation of the filter/project operations

Hardware implementation of the aggregation/group by operation: filt...

Hardware implementation of the aggregation/group by operation: hash...

Offset cancellation for DC isolated nodes

Offset cancellation for DC isolated nodes

Voltage margin testing for proximity communication

Determining chip separation by comparing coupling capacitances

Method and apparatus for biasing a floating node in an integrated c...

Determining chip separation by comparing coupling capacitances

Apparatus and method for high-throughput asynchronous communication...

Measuring chip-to-chip capacitance differentials by demodulating si...

Patents Applicationslast 30 patents

OFFSET CANCELLATION FOR DC ISOLATED NODES

HARDWARE IMPLEMENTATION OF THE FILTER/PROJECT OPERATIONS

HARDWARE IMPLEMENTATION OF THE AGGREGATION/GROUP BY OPERATION: HASH...

HARDWARE IMPLEMENTATION OF THE AGGREGATION/GROUP BY OPERATION: FILT...

OFFSET CANCELLATION FOR DC ISOLATED NODES

DETERMINING CHIP SEPARATION BY COMPARING COUPLING CAPACITANCES

VOLTAGE MARGIN TESTING FOR PROXIMITY COMMUNICATION

Determining chip separation by comparing coupling capacitances

Measuring chip-to-chip capacitance differentials by demodulating si...