Justin W. Wong

Person

South Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Manufacturing management using tool operating data
- Patent number 8,634,949
- Issue date Jan 21, 2014
- International Business Machines Corporation
- Brian C. Barker
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
In situ monitoring of wafer charge distribution in plasma processing
- Patent number 7,864,502
- Issue date Jan 4, 2011
- International Business Machines Corporation
- Kevin M Boyd
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tool for reporting the status and drill-down of a control applicati...
- Patent number 7,835,814
- Issue date Nov 16, 2010
- International Business Machines Corporation
- Michael W. Mock
- G05 - CONTROLLING REGULATING
Information Patent Grant
Tool to report the status and drill-down of an application in an au...
- Patent number 7,805,639
- Issue date Sep 28, 2010
- International Business Machines Corporation
- Michael W. Mock
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for reporting the status and drill-down of a control applica...
- Patent number 7,793,162
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Michael W. Mock
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for reporting the status of a control application in an auto...
- Patent number 7,493,236
- Issue date Feb 17, 2009
- International Business Machines Corporation
- Michael W. Mock
- G05 - CONTROLLING REGULATING
Information Patent Grant
STI fill for SOI which makes SOI inspectable
- Patent number 6,121,064
- Issue date Sep 19, 2000
- International Business Machines Corporation
- Jerome B. Lasky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real time measurement of etch rate during a chemical etching process
- Patent number 5,788,801
- Issue date Aug 4, 1998
- International Business Machines Corporation
- Steven George Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus for chemical vapor deposition of aluminum oxide
- Patent number 5,728,222
- Issue date Mar 17, 1998
- International Business Machines Corporation
- Steven George Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of aluminum oxide low pressure chemical vapor deposition (LP...
- Patent number 5,665,608
- Issue date Sep 9, 1997
- International Business Machines Corporation
- Jonathan Daniel Chapple-Sokol
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Aluminum oxide LPCVD system
- Patent number 5,648,113
- Issue date Jul 15, 1997
- International Business Machines Corporation
- Steven George Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for chemical vapor deposition of aluminum oxide
- Patent number 5,614,247
- Issue date Mar 25, 1997
- International Business Machines Corporation
- Steven G. Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Real time measurement of etch rate during a chemical etching process
- Patent number 5,582,746
- Issue date Dec 10, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Chemical etch monitor for measuring film etching uniformity during...
- Patent number 5,573,624
- Issue date Nov 12, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Aluminum oxide LPCVD system
- Patent number 5,540,777
- Issue date Jul 30, 1996
- International Business Machines Corporation
- Steven G. Barbee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Contactless real-time in-situ monitoring of a chemical etching
- Patent number 5,516,399
- Issue date May 14, 1996
- International Business Machines Corporation
- Michael J. Balconi-Lamica
- B24 - GRINDING POLISHING
Information Patent Grant
Minimizing overetch during a chemical etching process
- Patent number 5,501,766
- Issue date Mar 26, 1996
- International Business Machines Corporation
- Steven G. Barbee
- G01 - MEASURING TESTING
Information Patent Grant
Real time measurement of etch rate during a chemical etching process
- Patent number 5,500,073
- Issue date Mar 19, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Measuring film etching uniformity during a chemical etching process
- Patent number 5,489,361
- Issue date Feb 6, 1996
- International Business Machines Corporation
- Steven G. Barbee
- B24 - GRINDING POLISHING
Information Patent Grant
Aluminum oxide low pressure chemical vapor deposition (LPCVD) syste...
- Patent number 5,431,734
- Issue date Jul 11, 1995
- International Business Machines Corporation
- Jonathan D. Chapple-Sokol
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Removable gas injectors for use in chemical vapor deposition of alu...
- Patent number 5,425,810
- Issue date Jun 20, 1995
- Internation Business Machines Corporation
- Richard A. Conti
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
MULTI-MODAL DATA ANALYSIS FOR DEFECT IDENTIFICATION
- Publication number 20130103336
- Publication date Apr 25, 2013
- International Business Machines Corporation
- Lisa Amini
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing Management Using Tool Operating Data
- Publication number 20110288668
- Publication date Nov 24, 2011
- International Business Machines Corporation
- Brian C. Barker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR REAL TIME FAULT DETECTION IN HIGH SPEED SE...
- Publication number 20100014748
- Publication date Jan 21, 2010
- International Business Machines Corporation
- Mark L. Reath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOOL FOR REPORTING THE STATUS AND DRILL-DOWN OF A CONTROL APPLICATI...
- Publication number 20090049345
- Publication date Feb 19, 2009
- Michael W. Mock
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR REPORTING THE STATUS OF A CONTROL APPLICATION IN AN AUTO...
- Publication number 20090048700
- Publication date Feb 19, 2009
- Michael W. Mock
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR REPORTING THE STATUS AND DRILL-DOWN OF A CONTROL APPLICA...
- Publication number 20090048701
- Publication date Feb 19, 2009
- International Business Machines Corporation (IBM Corporation)
- Michael W. Mock
- G05 - CONTROLLING REGULATING
Information Patent Application
IN SITU MONITORING OF WAFER CHARGE DISTRIBUTION IN PLASMA PROCESSING
- Publication number 20080285202
- Publication date Nov 20, 2008
- International Business Machines Corporation
- KEVIN M. BOYD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A MEASUREMENT TO DETERMINE PLASMA LEAKAGE
- Publication number 20050167396
- Publication date Aug 4, 2005
- International Business Machines Corporation
- Robert A. Calderoni
- G01 - MEASURING TESTING

Justin W. Wong

Person

Patents Grantslast 30 patents

Manufacturing management using tool operating data

In situ monitoring of wafer charge distribution in plasma processing

Tool for reporting the status and drill-down of a control applicati...

Tool to report the status and drill-down of an application in an au...

Method for reporting the status and drill-down of a control applica...

Method for reporting the status of a control application in an auto...

STI fill for SOI which makes SOI inspectable

Real time measurement of etch rate during a chemical etching process

Apparatus for chemical vapor deposition of aluminum oxide

Method of aluminum oxide low pressure chemical vapor deposition (LP...

Aluminum oxide LPCVD system

Apparatus for chemical vapor deposition of aluminum oxide

Real time measurement of etch rate during a chemical etching process

Chemical etch monitor for measuring film etching uniformity during...

Aluminum oxide LPCVD system

Contactless real-time in-situ monitoring of a chemical etching

Minimizing overetch during a chemical etching process

Real time measurement of etch rate during a chemical etching process

Measuring film etching uniformity during a chemical etching process

Aluminum oxide low pressure chemical vapor deposition (LPCVD) syste...

Removable gas injectors for use in chemical vapor deposition of alu...

Patents Applicationslast 30 patents

MULTI-MODAL DATA ANALYSIS FOR DEFECT IDENTIFICATION

Manufacturing Management Using Tool Operating Data

METHOD AND APPARATUS FOR REAL TIME FAULT DETECTION IN HIGH SPEED SE...

TOOL FOR REPORTING THE STATUS AND DRILL-DOWN OF A CONTROL APPLICATI...

METHOD FOR REPORTING THE STATUS OF A CONTROL APPLICATION IN AN AUTO...

METHOD FOR REPORTING THE STATUS AND DRILL-DOWN OF A CONTROL APPLICA...

IN SITU MONITORING OF WAFER CHARGE DISTRIBUTION IN PLASMA PROCESSING

A MEASUREMENT TO DETERMINE PLASMA LEAKAGE