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Justin Wai-Chow Wong
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South Burlington, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-modal data analysis for defect identification
Patent number
8,260,034
Issue date
Sep 4, 2012
International Business Machines Corporation
Lisa Amini
G01 - MEASURING TESTING
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Patent Grant
Hierarchical and incremental multivariate analysis for process control
Patent number
8,233,494
Issue date
Jul 31, 2012
International Business Machines Corporation
Lisa Amini
G05 - CONTROLLING REGULATING
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Patent Grant
Method and system for causal modeling and outlier detection
Patent number
8,140,301
Issue date
Mar 20, 2012
International Business Machines Corporation
Naoki Abe
G05 - CONTROLLING REGULATING
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Patent Grant
Measurement to determine plasma leakage
Patent number
7,115,210
Issue date
Oct 3, 2006
International Business Machines Corporation
Robert A. Calderoni
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF PROCESS MODULES PERFORMANCE MATCHING
Publication number
20100063610
Publication date
Mar 11, 2010
David Angell
G05 - CONTROLLING REGULATING
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Patent Application
Multi-Modal Data Analysis for Defect Identification
Publication number
20090185739
Publication date
Jul 23, 2009
Lisa Amini
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Hierarchical and Incremental Multivariate Analysis for Process Control
Publication number
20090185493
Publication date
Jul 23, 2009
Lisa Amini
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and Computer Program Product for Wafer Manufacturing Process...
Publication number
20090137068
Publication date
May 28, 2009
Michal Rosen-Zvi
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND SYSTEM FOR CAUSAL MODELING AND OUTLIER DETECTION
Publication number
20080270088
Publication date
Oct 30, 2008
International Business Machines Corporation
Naoki Abe
G05 - CONTROLLING REGULATING