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Ka Ng Chui
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Menlo Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Detachable probe card interface
Patent number
10,209,275
Issue date
Feb 19, 2019
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Grant
Compressible pin assembly having frictionlessly connected contact e...
Patent number
9,831,589
Issue date
Nov 28, 2017
Corad Technology Inc.
Ka Ng Chui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compressible pin assembly having frictionlessly connected contact e...
Patent number
9,570,828
Issue date
Feb 14, 2017
Corad Technology Inc.
Ka Ng Chui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fine pitch interface for probe card
Patent number
9,151,799
Issue date
Oct 6, 2015
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETACHABLE PROBE CARD INTERFACE
Publication number
20180372778
Publication date
Dec 27, 2018
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT E...
Publication number
20170110820
Publication date
Apr 20, 2017
Corad Technology Inc.
Ka Ng Chui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT E...
Publication number
20140199895
Publication date
Jul 17, 2014
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
FINE PITCH INTERFACE FOR PROBE CARD
Publication number
20140091826
Publication date
Apr 3, 2014
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT E...
Publication number
20140094071
Publication date
Apr 3, 2014
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
FINE PITCH INTERFACE FOR PROBE CARD
Publication number
20140091818
Publication date
Apr 3, 2014
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
FINE PITCH INTERFACE FOR PROBE CARD
Publication number
20140091825
Publication date
Apr 3, 2014
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
Resonant test probe for integrated circuits
Publication number
20130021050
Publication date
Jan 24, 2013
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
Vertical probe intrface system
Publication number
20100330830
Publication date
Dec 30, 2010
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
Probe card having cantilever probes
Publication number
20080106292
Publication date
May 8, 2008
Corad Technology, Inc.
Ka Ng Chui
G01 - MEASURING TESTING
Information
Patent Application
Probe card having vertical probes
Publication number
20080048685
Publication date
Feb 28, 2008
Corad Technology Inc.
Ka Ng Chui
G01 - MEASURING TESTING