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last 30 patents
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Patent Grant
Apparatus for testing multiple semiconductor dice with increased th...
Patent number
9,989,587
Issue date
Jun 5, 2018
ASM Technology Singapore Pte. Ltd.
Yam Mo Wong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS FOR TESTING MULTIPLE SEMICONDUCTOR DICE WITH INCREASED TH...
Publication number
20160334464
Publication date
Nov 17, 2016
ASM Technology Singapore Pte Ltd
Yam Mo WONG
G01 - MEASURING TESTING