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Kah S. Seah
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Singapore, SG
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last 30 patents
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Patent Grant
Bend testing apparatus and method of carrying out the same
Patent number
7,464,606
Issue date
Dec 16, 2008
Agency for Science, Technology and Research
Ee Hua Wong
G01 - MEASURING TESTING
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Patent Grant
Method for making electrical local interconnects
Patent number
5,624,871
Issue date
Apr 29, 1997
Chartered Semiconductor Manufacturing Pte Ltd
Yeow M. Teo
H01 - BASIC ELECTRIC ELEMENTS