Kai-Chao CHAN

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Tao-Yuan City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method of semiconductor overlay measuring and method of semiconduct...
- Patent number 12,014,961
- Issue date Jun 18, 2024
- NANYA TECHNOLOGY CORPORATION
- Kai-Ping Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical detecting device and calibrating method
- Patent number 11,209,371
- Issue date Dec 28, 2021
- CHROMA ATE INC.
- Yu-Hsin Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF SEMICONDUCTOR OVERLAY MEASURING AND METHOD OF SEMICONDUCT...
- Publication number 20220336292
- Publication date Oct 20, 2022
- NANYA TECHNOLOGY CORPORATION
- Kai-Ping CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL DETECTING DEVICE AND CALIBRATING METHOD
- Publication number 20200191724
- Publication date Jun 18, 2020
- CHROMA ATE INC.
- Yu-Hsin LIU
- G01 - MEASURING TESTING