Kai Esmark

Person

Neuried, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Silicon controlled rectifier and manufacturing method therefor
- Patent number 11,121,126
- Issue date Sep 14, 2021
- Infineon Technologies AG
- Christian Cornelius Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 10,756,081
- Issue date Aug 25, 2020
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit including lateral insulated gate field effect tr...
- Patent number 9,899,367
- Issue date Feb 20, 2018
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 9,812,438
- Issue date Nov 7, 2017
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor ESD device and method of making same
- Patent number 9,263,430
- Issue date Feb 16, 2016
- Infineon Technologies AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 9,257,523
- Issue date Feb 9, 2016
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor device including a silicon contro...
- Patent number 8,956,924
- Issue date Feb 17, 2015
- Infineon Technologies AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche diode having an enhanced defect concentration level and m...
- Patent number 8,791,547
- Issue date Jul 29, 2014
- Infineon Technologies AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming electrostatic discharge devices
- Patent number 8,623,731
- Issue date Jan 7, 2014
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor ESD device and method of making same
- Patent number 8,471,292
- Issue date Jun 25, 2013
- Infineon Technologies AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge devices
- Patent number 8,350,355
- Issue date Jan 8, 2013
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD and EMC optimized HV-MOS transistor
- Patent number 8,304,806
- Issue date Nov 6, 2012
- Infineon Technologies AG
- Karl-heinz Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor ESD device and method of making same
- Patent number 8,178,897
- Issue date May 15, 2012
- Infineon Technologies AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit arrangement with shockley diode or thyristor and...
- Patent number 8,129,292
- Issue date Mar 6, 2012
- Infineon Technologies AG
- Ulrich Glaser
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Integrated circuit arrangements with ESD-resistant capacitor and co...
- Patent number 8,076,728
- Issue date Dec 13, 2011
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor ESD device and method of making same
- Patent number 7,985,983
- Issue date Jul 26, 2011
- Infineon Technologies AG
- Cornelius Christian Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit arrangements with ESD-resistant capacitor and co...
- Patent number 7,986,009
- Issue date Jul 26, 2011
- Infineon Technologies AG
- Kai Esmark
Information Patent Grant
Integrated circuit arrangement with Shockley diode or thyristor and...
- Patent number 7,888,701
- Issue date Feb 15, 2011
- Infineon Technologies AG
- Ulrich Glaser
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor ESD device and method of making same
- Patent number 7,800,128
- Issue date Sep 21, 2010
- Infineon Technologies AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor ESD device and method of making same
- Patent number 7,732,834
- Issue date Jun 8, 2010
- Infineon Technologies AG
- Cornelius Christian Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identification of ESD and latch-up weak points in an integrated cir...
- Patent number 7,694,247
- Issue date Apr 6, 2010
- Infineon Technologies AG
- Kai Esmark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit arrangement with shockley diode or thyristor and...
- Patent number 7,679,103
- Issue date Mar 16, 2010
- Infineon Technologies AG
- Ulrich Glaser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for protecting integrated circuits against electrostatic di...
- Patent number 7,359,169
- Issue date Apr 15, 2008
- Infineon Technologies AG
- Kai Esmark
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
ESD protection device
- Patent number 7,279,726
- Issue date Oct 9, 2007
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS transistor and ESD protective device each having a settable vol...
- Patent number 7,202,527
- Issue date Apr 10, 2007
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protective circuit with collector-current-controlled triggering...
- Patent number 7,087,938
- Issue date Aug 8, 2006
- Infineon Technologies AG
- Martin Streibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for testing the ESD resistance of a semiconductor...
- Patent number 7,009,404
- Issue date Mar 7, 2006
- Infineon Technologies AG
- Martin Wendel
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining an ESD/latch-up strength of an integrated ci...
- Patent number 6,930,501
- Issue date Aug 16, 2005
- Infineon Technologies AG
- Silke Bargstädt-Franke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating method for a semiconductor component
- Patent number 6,905,892
- Issue date Jun 14, 2005
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a MOS transistor and MOS transistor
- Patent number 6,884,688
- Issue date Apr 26, 2005
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Silicon Controlled Rectifier and Manufacturing Method Therefor
- Publication number 20200243507
- Publication date Jul 30, 2020
- Christian Cornelius Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Avalanche Diode Having an Enhanced Defect Concentration Level and M...
- Publication number 20180033783
- Publication date Feb 1, 2018
- INFINEON TECHNOLOGIES AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Including Lateral Insulated Gate Field Effect Tr...
- Publication number 20160336308
- Publication date Nov 17, 2016
- INFINEON TECHNOLOGIES AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD/EOS DETECTION
- Publication number 20160172849
- Publication date Jun 16, 2016
- INFINEON TECHNOLOGIES AG
- Donald DIBRA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Avalanche Diode Having an Enhanced Defect Concentration Level and M...
- Publication number 20160111413
- Publication date Apr 21, 2016
- INFINEON TECHNOLOGIES AG
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD Device and Method of Making Same
- Publication number 20150144996
- Publication date May 28, 2015
- INFINEON TECHNOLOGIES AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Avalanche Diode Having an Enhanced Defect Concentration Level and M...
- Publication number 20140291808
- Publication date Oct 2, 2014
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD Device and Method of Making Same
- Publication number 20130277712
- Publication date Oct 24, 2013
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Forming Electrostatic Discharge Devices
- Publication number 20130122677
- Publication date May 16, 2013
- INFINEON TECHNOLOGIES AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD Device and Method of Making Same
- Publication number 20120218671
- Publication date Aug 30, 2012
- INFINEON TECHNOLOGIES AG
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD and EMC optimized HV-MOS Transistor
- Publication number 20110303948
- Publication date Dec 15, 2011
- INFINEON TECHNOLOGIES AG
- Karl-heinz Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Discharge Devices
- Publication number 20110210418
- Publication date Sep 1, 2011
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD Device and Method of Making Same
- Publication number 20100321843
- Publication date Dec 23, 2010
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD Device and Method of Making Same
- Publication number 20100208405
- Publication date Aug 19, 2010
- Cornelius Christian Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT ARRANGEMENT WITH SHOCKLEY DIODE OR THYRISTOR AND...
- Publication number 20100120208
- Publication date May 13, 2010
- Infineon Technologies AG
- Ulrich Glaser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT ARRANGEMENT WITH SHOCKLEY DIODE OR THYRISTOR AND...
- Publication number 20100117116
- Publication date May 13, 2010
- Infineon Technologies AG
- Ulrich Glaser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD Device and Method of Making Same
- Publication number 20090309129
- Publication date Dec 17, 2009
- Krzysztof Domanski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Arrangements With ESD-Resistant Capacitor and Co...
- Publication number 20090283859
- Publication date Nov 19, 2009
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Arrangements With ESD-Resistant Capacitor and Co...
- Publication number 20090283810
- Publication date Nov 19, 2009
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD/EOS Performance by Introduction of Defects
- Publication number 20090185316
- Publication date Jul 23, 2009
- Jens Schneider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor ESD device and method of making same
- Publication number 20080179624
- Publication date Jul 31, 2008
- Cornelius Christian Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Esd test arrangement and method
- Publication number 20070165344
- Publication date Jul 19, 2007
- Infineon Technologies AG
- Kai Esmark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated circuit arrangement with shockley diode or thyristor and...
- Publication number 20070158750
- Publication date Jul 12, 2007
- Ulrich Glaser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit arrangements with ESD-resistant capacitor and co...
- Publication number 20070034959
- Publication date Feb 15, 2007
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process and electrostatic discharge protection device for the prote...
- Publication number 20060261412
- Publication date Nov 23, 2006
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protection device
- Publication number 20060238937
- Publication date Oct 26, 2006
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit for protecting integrated circuits against electrostatic di...
- Publication number 20060056121
- Publication date Mar 16, 2006
- Kai Esmark
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Transistor comprising fill areas in the source drain and/or drain r...
- Publication number 20050263817
- Publication date Dec 1, 2005
- Martin Wendel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protective circuit with collector-current-controlled triggering...
- Publication number 20050195540
- Publication date Sep 8, 2005
- Martin Streibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining an ESD/latch-up strength of an integrated ci...
- Publication number 20050003564
- Publication date Jan 6, 2005
- Silke Bargstadt-Franke
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Silicon controlled rectifier and manufacturing method therefor

Avalanche diode having an enhanced defect concentration level and m...

Integrated circuit including lateral insulated gate field effect tr...

Avalanche diode having an enhanced defect concentration level and m...

Semiconductor ESD device and method of making same

Avalanche diode having an enhanced defect concentration level and m...

Method of forming a semiconductor device including a silicon contro...

Avalanche diode having an enhanced defect concentration level and m...

Methods of forming electrostatic discharge devices

Semiconductor ESD device and method of making same

Electrostatic discharge devices

ESD and EMC optimized HV-MOS transistor

Semiconductor ESD device and method of making same

Integrated circuit arrangement with shockley diode or thyristor and...

Integrated circuit arrangements with ESD-resistant capacitor and co...

Semiconductor ESD device and method of making same

Integrated circuit arrangements with ESD-resistant capacitor and co...

Integrated circuit arrangement with Shockley diode or thyristor and...

Semiconductor ESD device and method of making same

Semiconductor ESD device and method of making same

Identification of ESD and latch-up weak points in an integrated cir...

Integrated circuit arrangement with shockley diode or thyristor and...

Circuit for protecting integrated circuits against electrostatic di...

ESD protection device

MOS transistor and ESD protective device each having a settable vol...

ESD protective circuit with collector-current-controlled triggering...

Method and device for testing the ESD resistance of a semiconductor...

Method for determining an ESD/latch-up strength of an integrated ci...

Operating method for a semiconductor component

Method for producing a MOS transistor and MOS transistor

Patents Applicationslast 30 patents

Silicon Controlled Rectifier and Manufacturing Method Therefor

Avalanche Diode Having an Enhanced Defect Concentration Level and M...

Integrated Circuit Including Lateral Insulated Gate Field Effect Tr...

ESD/EOS DETECTION

Avalanche Diode Having an Enhanced Defect Concentration Level and M...

Semiconductor ESD Device and Method of Making Same

Avalanche Diode Having an Enhanced Defect Concentration Level and M...

Semiconductor ESD Device and Method of Making Same

Methods of Forming Electrostatic Discharge Devices

Semiconductor ESD Device and Method of Making Same

ESD and EMC optimized HV-MOS Transistor

Electrostatic Discharge Devices

Semiconductor ESD Device and Method of Making Same

Semiconductor ESD Device and Method of Making Same

INTEGRATED CIRCUIT ARRANGEMENT WITH SHOCKLEY DIODE OR THYRISTOR AND...

INTEGRATED CIRCUIT ARRANGEMENT WITH SHOCKLEY DIODE OR THYRISTOR AND...

Semiconductor ESD Device and Method of Making Same

Integrated Circuit Arrangements With ESD-Resistant Capacitor and Co...

Integrated Circuit Arrangements With ESD-Resistant Capacitor and Co...

ESD/EOS Performance by Introduction of Defects

Semiconductor ESD device and method of making same

Esd test arrangement and method

Integrated circuit arrangement with shockley diode or thyristor and...

Integrated circuit arrangements with ESD-resistant capacitor and co...

Process and electrostatic discharge protection device for the prote...

ESD protection device

Circuit for protecting integrated circuits against electrostatic di...

Transistor comprising fill areas in the source drain and/or drain r...

ESD protective circuit with collector-current-controlled triggering...

Method for determining an ESD/latch-up strength of an integrated ci...