Kai Feng

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
On-chip randomness generation
- Patent number 9,985,615
- Issue date May 29, 2018
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Commonly-bodied field-effect transistors
- Patent number 9,818,652
- Issue date Nov 14, 2017
- GLOBALFOUNDRIES Inc.
- Chengwen Pei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical unclonable interconnect function array
- Patent number 9,768,110
- Issue date Sep 19, 2017
- International Business Machines Corporation
- Kai D. Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Structure and method for in-line defect non-contact tests
- Patent number 9,721,854
- Issue date Aug 1, 2017
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Frequency-locked voltage regulated loop
- Patent number 9,503,106
- Issue date Nov 22, 2016
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Physical unclonable interconnect function array
- Patent number 9,391,014
- Issue date Jul 12, 2016
- International Business Machines Corporation
- Kai D. Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Air gap electrostatic discharge structure for high speed circuits
- Patent number 9,380,688
- Issue date Jun 28, 2016
- International Business Machines Corporation
- Kai D. Feng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for fabricating a physical unclonable interconnect function...
- Patent number 9,331,012
- Issue date May 3, 2016
- International Business Machines Corporation
- Kai D. Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Embedded on-chip security
- Patent number 9,281,236
- Issue date Mar 8, 2016
- GLOBALFOUNDRIES Inc.
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Frequency calibration with real-time resistor trimming
- Patent number 9,252,794
- Issue date Feb 2, 2016
- International Business Machines Corporation
- Kai Di Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Precision trench capacitor
- Patent number 9,240,406
- Issue date Jan 19, 2016
- GLOBALFOUNDRIES Inc.
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ring oscillator testing with power sensing resistor
- Patent number 9,217,769
- Issue date Dec 22, 2015
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Grant
On-chip structure for security application
- Patent number 9,189,654
- Issue date Nov 17, 2015
- International Business Machines Corporation
- Kai Di Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photoresist collapse method for forming a physical unclonable function
- Patent number 9,190,360
- Issue date Nov 17, 2015
- GLOBALFOUNDRIES Inc.
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including enhanced variability
- Patent number 9,166,588
- Issue date Oct 20, 2015
- GLOBALFOUNDIRES INC.
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Embedded on-chip security
- Patent number 9,117,824
- Issue date Aug 25, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation signal measurement system for millimeter wave transceivers
- Patent number 9,103,855
- Issue date Aug 11, 2015
- International Business Machines Corporation
- Randall M. Burnett
- G01 - MEASURING TESTING
Information Patent Grant
Clock phase shift detector
- Patent number 9,077,319
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methodology and apparatus for tuning driving current of semiconduct...
- Patent number 9,059,204
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Grant
Structure of very high insertion loss of the substrate noise decoup...
- Patent number 9,059,183
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing structure and method of using the testing structure
- Patent number 9,013,202
- Issue date Apr 21, 2015
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FET pair based physically unclonable function (PUF) circuit with a...
- Patent number 8,941,405
- Issue date Jan 27, 2015
- International Business Machines Corporation
- Howard H. Chi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Analyzing EM performance during IC manufacturing
- Patent number 8,917,104
- Issue date Dec 23, 2014
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Real-time on-chip EM performance monitoring
- Patent number 8,890,556
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
On-chip transmission line structures with balanced phase delay
- Patent number 8,860,191
- Issue date Oct 14, 2014
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for determination of TSV depth
- Patent number 8,853,693
- Issue date Oct 7, 2014
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit pad modeling
- Patent number 8,806,415
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Hanyi Ding
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High frequency CMOS programmable divider with large divide ratio
- Patent number 8,791,728
- Issue date Jul 29, 2014
- International Business Machines Corporation
- John S. Austin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methodology and apparatus for tuning driving current of semiconduct...
- Patent number 8,779,838
- Issue date Jul 15, 2014
- International Business Machines Corporation
- Zhijian Yang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure having vias and high density capacitors
- Patent number 8,674,423
- Issue date Mar 18, 2014
- International Business Machines Corporation
- David S. Collins
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ISOLATION STRUCTURES FOR CIRCUITS SHARING A SUBSTRATE
- Publication number 20170317166
- Publication date Nov 2, 2017
- GLOBALFOUNDRIES INC.
- Chengwen Pei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMMONLY-BODIED FIELD-EFFECT TRANSISTORS
- Publication number 20170316986
- Publication date Nov 2, 2017
- GLOBALFOUNDRIES INC.
- Chengwen Pei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP RANDOMNESS GENERATION
- Publication number 20170141771
- Publication date May 18, 2017
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY
- Publication number 20160190005
- Publication date Jun 30, 2016
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION
- Publication number 20160071742
- Publication date Mar 10, 2016
- GLOBALFOUNDRIES INC.
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY
- Publication number 20150348899
- Publication date Dec 3, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECISION TRENCH CAPACITOR
- Publication number 20150303191
- Publication date Oct 22, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMBEDDED ON-CHIP SECURITY
- Publication number 20150255326
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION
- Publication number 20150235964
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING ENHANCED VARIABILITY
- Publication number 20150207505
- Publication date Jul 23, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP STRUCTURE FOR SECURITY APPLICATION
- Publication number 20150154421
- Publication date Jun 4, 2015
- International Business Machines Corporation
- Kai Di Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMBEDDED ON-CHIP SECURITY
- Publication number 20150084193
- Publication date Mar 26, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURST NOISE IN LINE TEST
- Publication number 20140253169
- Publication date Sep 11, 2014
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD MODELING
- Publication number 20140237438
- Publication date Aug 21, 2014
- International Business Machines Corporation
- Hanyi DING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodology and Apparatus for Tuning Driving Current of Semiconduct...
- Publication number 20140234990
- Publication date Aug 21, 2014
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP RANDOMNESS GENERATION
- Publication number 20140197865
- Publication date Jul 17, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOCK PHASE SHIFT DETECTOR
- Publication number 20140159775
- Publication date Jun 12, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STRUCTURE AND METHOD FOR IN-LINE DEFECT NON-CONTACT TESTS
- Publication number 20140152337
- Publication date Jun 5, 2014
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
RADIATION SIGNAL MEASUREMENT SYSTEM FOR MILLIMETER WAVE TRANSCEIVERS
- Publication number 20140104092
- Publication date Apr 17, 2014
- International Business Machines Corporation
- RANDALL M. BURNETT
- G01 - MEASURING TESTING
Information Patent Application
RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR
- Publication number 20140097858
- Publication date Apr 10, 2014
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
FET PAIR BASED PHYSICALLY UNCLONABLE FUNCTION (PUF) CIRCUIT WITH A...
- Publication number 20140035670
- Publication date Feb 6, 2014
- International Business Machines Corporation
- Howard H. Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING STRUCTURE AND METHOD OF USING THE TESTING STRUCTURE
- Publication number 20130314119
- Publication date Nov 28, 2013
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UTILIZING A SENSE AMPLIFIER TO SELECT A SUITABLE CIRCUIT
- Publication number 20130241652
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Howard H. Chi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Physical Unclonable Interconnect Function Array
- Publication number 20130233608
- Publication date Sep 12, 2013
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION CELL AND ARRAY
- Publication number 20130222013
- Publication date Aug 29, 2013
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HIGH FREQUENCY QUADRATURE PLL CIRCUIT AND METHOD
- Publication number 20130147530
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Hanyi DING
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STRUCTURE OF VERY HIGH INSERTION LOSS OF THE SUBSTRATE NOISE DECOUP...
- Publication number 20130134566
- Publication date May 30, 2013
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REAL-TIME ON-CHIP EM PERFORMANCE MONITORING
- Publication number 20130106452
- Publication date May 2, 2013
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
METHODOLOGY AND APPARATUS FOR TUNING DRIVING CURRENT OF SEMICONDUCT...
- Publication number 20130099853
- Publication date Apr 25, 2013
- International Business Machines Corporation
- Zhijian Yang
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY CMOS PROGRAMMABLE DIVIDER WITH LARGE DIVIDE RATIO
- Publication number 20130093463
- Publication date Apr 18, 2013
- International Business Machines Corporation
- John S. Austin
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

On-chip randomness generation

Commonly-bodied field-effect transistors

Physical unclonable interconnect function array

Structure and method for in-line defect non-contact tests

Frequency-locked voltage regulated loop

Physical unclonable interconnect function array

Air gap electrostatic discharge structure for high speed circuits

Method for fabricating a physical unclonable interconnect function...

Embedded on-chip security

Frequency calibration with real-time resistor trimming

Precision trench capacitor

Ring oscillator testing with power sensing resistor

On-chip structure for security application

Photoresist collapse method for forming a physical unclonable function

Semiconductor device including enhanced variability

Embedded on-chip security

Radiation signal measurement system for millimeter wave transceivers

Clock phase shift detector

Methodology and apparatus for tuning driving current of semiconduct...

Structure of very high insertion loss of the substrate noise decoup...

Testing structure and method of using the testing structure

FET pair based physically unclonable function (PUF) circuit with a...

Analyzing EM performance during IC manufacturing

Real-time on-chip EM performance monitoring

On-chip transmission line structures with balanced phase delay

Test structure for determination of TSV depth

Integrated circuit pad modeling

High frequency CMOS programmable divider with large divide ratio

Methodology and apparatus for tuning driving current of semiconduct...

Semiconductor structure having vias and high density capacitors

Patents Applicationslast 30 patents

ISOLATION STRUCTURES FOR CIRCUITS SHARING A SUBSTRATE

COMMONLY-BODIED FIELD-EFFECT TRANSISTORS

ON-CHIP RANDOMNESS GENERATION

PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY

PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION

PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY

PRECISION TRENCH CAPACITOR

EMBEDDED ON-CHIP SECURITY

PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION

SEMICONDUCTOR DEVICE INCLUDING ENHANCED VARIABILITY

ON-CHIP STRUCTURE FOR SECURITY APPLICATION

EMBEDDED ON-CHIP SECURITY

BURST NOISE IN LINE TEST

INTEGRATED CIRCUIT PAD MODELING

Methodology and Apparatus for Tuning Driving Current of Semiconduct...

ON-CHIP RANDOMNESS GENERATION

CLOCK PHASE SHIFT DETECTOR

STRUCTURE AND METHOD FOR IN-LINE DEFECT NON-CONTACT TESTS

RADIATION SIGNAL MEASUREMENT SYSTEM FOR MILLIMETER WAVE TRANSCEIVERS

RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR

FET PAIR BASED PHYSICALLY UNCLONABLE FUNCTION (PUF) CIRCUIT WITH A...

TESTING STRUCTURE AND METHOD OF USING THE TESTING STRUCTURE

UTILIZING A SENSE AMPLIFIER TO SELECT A SUITABLE CIRCUIT

Physical Unclonable Interconnect Function Array

PHYSICAL UNCLONABLE FUNCTION CELL AND ARRAY

HIGH FREQUENCY QUADRATURE PLL CIRCUIT AND METHOD

STRUCTURE OF VERY HIGH INSERTION LOSS OF THE SUBSTRATE NOISE DECOUP...

REAL-TIME ON-CHIP EM PERFORMANCE MONITORING

METHODOLOGY AND APPARATUS FOR TUNING DRIVING CURRENT OF SEMICONDUCT...

HIGH FREQUENCY CMOS PROGRAMMABLE DIVIDER WITH LARGE DIVIDE RATIO