Kai-Hung Alex See

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting semiconductor manufacturing conditions
- Patent number 7,553,678
- Issue date Jun 30, 2009
- United Microelectronics Corp.
- Wen-Zhan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reticle and optical proximity correction method
- Patent number 7,527,900
- Issue date May 5, 2009
- United Microelectronics Corp.
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING SEMICONDUCTOR MANUFACTURING CONDITIONS
- Publication number 20070220458
- Publication date Sep 20, 2007
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-ZONE CARRIER HEAD FOR CHEMICAL MECHANICAL POLISHING AND CMP M...
- Publication number 20070167110
- Publication date Jul 19, 2007
- Yu-Hsiang Tseng
- B24 - GRINDING POLISHING
Information Patent Application
RETICLE AND OPTICAL PROXIMITY CORRECTION METHOD
- Publication number 20070105023
- Publication date May 10, 2007
- Wen-Zhan Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF FORMING OPENING AND CONTACT
- Publication number 20070066047
- Publication date Mar 22, 2007
- Jianhui Ye
- H01 - BASIC ELECTRIC ELEMENTS