TREA

Kai LEI

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  • Shanghai, CN
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Patents Applicationslast 30 patents

  • Information Patent Application

    CHIP AND CHIP TESTING METHOD
    • Publication number 20230176141
    • Publication date Jun 8, 2023
    • Shanghai Biren Technology Co.,Ltd
    • Kai LEI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHIP AND CHIP TEST METHOD
    • Publication number 20230176118
    • Publication date Jun 8, 2023
    • Shanghai Biren Technology Co.,Ltd
    • Kai LEI
    • G01 - MEASURING TESTING