Kai-Yi Tang

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New Taipei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Antenna testing device for high frequency antennas
- Patent number 12,105,131
- Issue date Oct 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chi-Chang Lai
- G01 - MEASURING TESTING
Information Patent Grant
Antenna testing device and method for high frequency antennas
- Patent number 11,726,122
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Chang Lai
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method
- Patent number 9,285,394
- Issue date Mar 15, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Yi Tang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF...
- Publication number 20250093385
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Kuan Chun CHEN
- G01 - MEASURING TESTING
Information Patent Application
ANTENNA TESTING DEVICE FOR HIGH FREQUENCY ANTENNAS
- Publication number 20240377446
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chi-Chang LAI
- G01 - MEASURING TESTING
Information Patent Application
ANTENNA TESTING DEVICE FOR HIGH FREQUENCY ANTENNAS
- Publication number 20230333150
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chi-Chang LAI
- G01 - MEASURING TESTING
Information Patent Application
ANTENNA TESTING DEVICE AND METHOD FOR HIGH FREQUENCY ANTENNAS
- Publication number 20210405102
- Publication date Dec 30, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chi-Chang LAI
- G01 - MEASURING TESTING
Information Patent Application
Testing Apparatus And Method
- Publication number 20150192610
- Publication date Jul 9, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Yi Tang
- G01 - MEASURING TESTING