Kaifeng Zhang

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,877,065
- Issue date Dec 29, 2020
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray inspection method and X-ray inspection device
- Patent number 10,823,686
- Issue date Nov 3, 2020
- Hitachi High-Tech Science Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,429,411
- Issue date Oct 1, 2019
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray inspection method and device
- Patent number 10,352,879
- Issue date Jul 16, 2019
- Hitachi High-Technologies Corporaiton
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and its apparatus for thermal assist type magneti...
- Patent number 9,304,145
- Issue date Apr 5, 2016
- Hitachi High-Tech Fine Systems Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,787,134
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for magnetic force microscope and method of manufacturin...
- Patent number 8,621,659
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,483,035
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
- Publication number 20240060880
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro WATANABE
- G02 - OPTICS
Information Patent Application
SPECTROMETRY APPARATUS
- Publication number 20230332950
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
- Publication number 20220260611
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...
- Publication number 20190346480
- Publication date Nov 14, 2019
- Hitachi, Ltd
- Kaifeng ZHANG
- C01 - INORGANIC CHEMISTRY
Information Patent Application
Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...
- Publication number 20180372776
- Publication date Dec 27, 2018
- Hitachi, Ltd
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
- Publication number 20180202947
- Publication date Jul 19, 2018
- Hitachi High-Tech Science Corporation
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND DEVICE
- Publication number 20170261441
- Publication date Sep 14, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND EXTRANEOUS SUBSTANCE DE...
- Publication number 20160041110
- Publication date Feb 11, 2016
- Hitachi High-Technologies Corporation
- Yoshiki MATOBA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND ITS APPARATUS FOR THERMAL ASSIST TYPE MAGNETI...
- Publication number 20160033548
- Publication date Feb 4, 2016
- HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092717
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140096293
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HE...
- Publication number 20140086033
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...
- Publication number 20130265863
- Publication date Oct 10, 2013
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Thermally Assisted Magnetic Recording Head Inspection Method and Ap...
- Publication number 20120307605
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SPM Probe and Inspection Device for Light Emission Unit
- Publication number 20120054924
- Publication date Mar 1, 2012
- Hitachi High-Technologies Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING

Kaifeng Zhang

Person

Patents Grantslast 30 patents

Cantilever, scanning probe microscope, and measurement method using...

Near field scanning probe microscope, probe for scanning probe micr...

X-ray inspection method and X-ray inspection device

Near field scanning probe microscope, probe for scanning probe micr...

X-ray inspection method and device

Inspection method and its apparatus for thermal assist type magneti...

Thermally assisted magnetic recording head inspection method and ap...

Cantilever of scanning probe microscope and method for manufacturin...

Cantilever for magnetic force microscope and method of manufacturin...

Thermally assisted magnetic recording head inspection method and ap...

Patents Applicationslast 30 patents

SPECTROSCOPIC MEASUREMENT DEVICE

SPECTROMETRY APPARATUS

CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...

Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...

Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...

X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE

X-RAY INSPECTION METHOD AND DEVICE

X-RAY TRANSMISSION INSPECTION APPARATUS AND EXTRANEOUS SUBSTANCE DE...

INSPECTION METHOD AND ITS APPARATUS FOR THERMAL ASSIST TYPE MAGNETI...

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HE...

THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

Thermally Assisted Magnetic Recording Head Inspection Method and Ap...

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

SPM Probe and Inspection Device for Light Emission Unit