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KAIWEI WANG
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Hangzhou, CN
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last 30 patents
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Patent Grant
Wavelength scanning interferometer and method for aspheric surface...
Patent number
9,062,959
Issue date
Jun 23, 2015
Zhejiang University
Kaiwei Wang
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
WAVELENGTH SCANNING INTERFEROMETER AND METHOD FOR ASPHERIC SURFACE...
Publication number
20140218750
Publication date
Aug 7, 2014
Zhejiang University
KAIWEI WANG
G01 - MEASURING TESTING