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Kaiyu Ren
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San Jose, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Functional failure analysis techniques for programmable integrated...
Patent number
7,685,485
Issue date
Mar 23, 2010
Altera Corporation
Binh Vo
G01 - MEASURING TESTING
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Patent Grant
Bit error rate tester implemented in a programmable logic device
Patent number
7,194,666
Issue date
Mar 20, 2007
Altera Corporation
San Wong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Functional failure analysis techniques for programmable integrated...
Publication number
20050022085
Publication date
Jan 27, 2005
Altera Corporation
Binh Vo
G01 - MEASURING TESTING