KAIYUAN CHI

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Gyeonggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting pattern and an apparatus for manufacturing a...
- Patent number 9,965,851
- Issue date May 8, 2018
- Samsung Electronics Co., Ltd.
- Kaiyuan Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern analysis method of a semiconductor device
- Patent number 9,672,611
- Issue date Jun 6, 2017
- Samsung Electronics Co., Ltd.
- Kiho Yang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR INSPECTING PATTERN AND AN APPARATUS FOR MANUFACTURING A...
- Publication number 20160275663
- Publication date Sep 22, 2016
- Samsung Electronics Co., Ltd.
- Kaiyuan Chi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN ANALYSIS METHOD OF A SEMICONDUCTOR DEVICE
- Publication number 20160071261
- Publication date Mar 10, 2016
- Samsung Electronics Co., Ltd.
- KIHO YANG
- G01 - MEASURING TESTING