Kaizao Ni

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Single-beam photothermal measurement apparatus and measurement meth...
- Patent number 12,099,002
- Issue date Sep 24, 2024
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Shijie Liu
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect measuring apparatus and method by microscopic scatte...
- Patent number 11,175,220
- Issue date Nov 16, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Jianda Shao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE-BEAM PHOTOTHERMAL MEASUREMENT APPARATUS AND MEASUREMENT METH...
- Publication number 20220120675
- Publication date Apr 21, 2022
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Shijie LIU
- G02 - OPTICS
Information Patent Application
SURFACE DEFECT MEASURING APPARATUS AND METHOD BY MICROSCOPIC SCATTE...
- Publication number 20210010927
- Publication date Jan 14, 2021
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Jianda Shao
- G02 - OPTICS