Kal-Wen Tan

Person

  • Taipei City, TW

Patents Grantslast 30 patents

  • Information Patent Grant

    Method for substrate noise analysis

    • Patent number 8,627,253
    • Issue date Jan 7, 2014
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Tzu-Jin Yeh
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents