Kalin Valeriev LAZAROV

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
ADC with precision reference power saving mode
- Patent number 11,942,960
- Issue date Mar 26, 2024
- Analog Devices, Inc.
- George Pieter Reitsma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low temperature coefficient current sensor
- Patent number 11,714,108
- Issue date Aug 1, 2023
- Analog Devices International Unlimited Company
- Michael D. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature coefficient current sensor
- Patent number 11,378,595
- Issue date Jul 5, 2022
- Analog Devices International Unlimited Company
- Michael D. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor design using an epoxy film as an infrared absorptio...
- Patent number 10,570,006
- Issue date Feb 25, 2020
- Texas Instruments Incorporated
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Reference signal correction circuit
- Patent number 10,557,894
- Issue date Feb 11, 2020
- Linear Technology Holding LLC
- Kalin V. Lazarov
- G05 - CONTROLLING REGULATING
Information Patent Grant
Infrared sensor design using an epoxy film as an infrared absorptio...
- Patent number 10,526,198
- Issue date Jan 7, 2020
- Texas Instruments Incorporated
- Ricky Alan Jackson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
High speed on-chip precision buffer with switched-load rejection
- Patent number 10,367,486
- Issue date Jul 30, 2019
- Linear Technology Holding LLC
- Stephen Todd Van Duyne
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip calibration system and method for infrared sensor
- Patent number 9,921,110
- Issue date Mar 20, 2018
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Power supply system and method
- Patent number 9,478,982
- Issue date Oct 25, 2016
- Linear Technology Corporation
- Raymond Allen Stevens
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Infrared sensor structure and method
- Patent number 9,417,133
- Issue date Aug 16, 2016
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
On-chip calibration system and method for infrared sensor
- Patent number 9,360,376
- Issue date Jun 7, 2016
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Reducing thermal gradients to improve thermopile performance
- Patent number 9,166,083
- Issue date Oct 20, 2015
- Texas Instruments Incorporated
- Walter Meinel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Etching cavity structures in silicon under dielectric membrane
- Patent number 9,157,807
- Issue date Oct 13, 2015
- Texas Instruments Incorporated
- Walter B. Meinel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Accurate current sensing with heat transfer correction
- Patent number 8,920,026
- Issue date Dec 30, 2014
- Linear Technology Corporation
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Grant
Infrared light transmissivity for a membrane sensor
- Patent number 8,729,473
- Issue date May 20, 2014
- Texas Instruments Incorporated
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Heated air mass WCSP package and method for accelerometer
- Patent number 8,607,631
- Issue date Dec 17, 2013
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Infrared sensor structure and method
- Patent number 8,604,435
- Issue date Dec 10, 2013
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing thermopile variations
- Patent number 8,586,395
- Issue date Nov 19, 2013
- Texas Instruments Incorporated
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Ionic isolation ring
- Patent number 8,546,903
- Issue date Oct 1, 2013
- Texas Instruments Incorporated
- Walter Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Infrared light transmissivity for a membrane sensor
- Patent number 8,436,304
- Issue date May 7, 2013
- Texas Instruments Incorporated
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Vias in substrate between IC seat and peripheral thermal cage
- Patent number 8,411,442
- Issue date Apr 2, 2013
- Texas Instruments Incorporated
- Walter Meinel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated infrared sensors with optical elements, and methods
- Patent number 8,304,850
- Issue date Nov 6, 2012
- Texas Instruments Incorporated
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Grant
On-chip calibration system and method for infrared sensor
- Patent number 8,129,682
- Issue date Mar 6, 2012
- Texas Instruments Incorporated
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Grant
Silicon dioxide cantilever support and method for silicon etched st...
- Patent number 8,115,272
- Issue date Feb 14, 2012
- Texas Instruments Incorporated
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon dioxide cantilever support and method for silicon etched st...
- Patent number 8,114,779
- Issue date Feb 14, 2012
- Texas Instruments Incorporated
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon dioxide cantilever support and method for silicon etched st...
- Patent number 8,026,177
- Issue date Sep 27, 2011
- Texas Instruments Incorporated
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ADC WITH PRECISION REFERENCE POWER SAVING MODE
- Publication number 20230246652
- Publication date Aug 3, 2023
- Analog Devices, Inc.
- George Pieter Reitsma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PACKAGE STRESS SENSOR
- Publication number 20230049755
- Publication date Feb 16, 2023
- Analog Devices, Inc.
- George Pieter Reitsma et al.
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE STRESS SENSOR WITH HALL CANCELLATION
- Publication number 20230046102
- Publication date Feb 16, 2023
- Analog Devices, Inc.
- George Pieter Reitsma et al.
- G01 - MEASURING TESTING
Information Patent Application
LOW TEMPERATURE COEFFICIENT CURRENT SENSOR
- Publication number 20220365112
- Publication date Nov 17, 2022
- Analog Devices International Unlimited Company
- Michael D. Petersen
- G01 - MEASURING TESTING
Information Patent Application
LOW TEMPERATURE COEFFICIENT CURRENT SENSOR
- Publication number 20210382091
- Publication date Dec 9, 2021
- Michael D. Petersen
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED ON-CHIP PRECISION BUFFER WITH SWITCHED-LOAD REJECTION
- Publication number 20190131959
- Publication date May 2, 2019
- Linear Technology Holding LLC
- Stephen Todd VAN DUYNE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STRESS-IMPAIRED SIGNAL CORRECTION CIRCUIT
- Publication number 20190041471
- Publication date Feb 7, 2019
- LINEAR TECHNOLOGY HOLDINGS LLC
- Kalin V. LAZAROV
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE TEMPERATURE TESTING OF NON-VOLATILE MEMORY DATA RETENTION...
- Publication number 20180040384
- Publication date Feb 8, 2018
- Linear Technology Corporation
- Kalin V. LAZAROV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...
- Publication number 20170174505
- Publication date Jun 22, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan JACKSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR
- Publication number 20160282189
- Publication date Sep 29, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...
- Publication number 20150246810
- Publication date Sep 3, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan JACKSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
POWER SUPPLY SYSTEM AND METHOD
- Publication number 20150021987
- Publication date Jan 22, 2015
- Linear Technology Corporation
- Raymond Allen STEVENS
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR
- Publication number 20140151559
- Publication date Jun 5, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR STRUCTURE AND METHOD
- Publication number 20140131577
- Publication date May 15, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR
- Publication number 20130214159
- Publication date Aug 22, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Application
REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE
- Publication number 20130175072
- Publication date Jul 11, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTENDED AREA COVER PLATE FOR INTEGRATED INFRARED SENSOR
- Publication number 20130062720
- Publication date Mar 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Rick L. Wise
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS AND METHODS
- Publication number 20130043552
- Publication date Feb 21, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Application
Heated air mass WCSP package and method for accelerometer
- Publication number 20120266672
- Publication date Oct 25, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...
- Publication number 20120223400
- Publication date Sep 6, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Ricky Alan JACKSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Accurate Current Sensing with Heat Transfer Correction
- Publication number 20120218022
- Publication date Aug 30, 2012
- Linear Technology Corporation
- Kalin V. Lazarov
- G01 - MEASURING TESTING
Information Patent Application
Infrared gesture recognition device and method
- Publication number 20120200486
- Publication date Aug 9, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR
- Publication number 20120138800
- Publication date Jun 7, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REDUCING THERMOPILE VARIATIONS
- Publication number 20120139077
- Publication date Jun 7, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Application
IONIC ISOLATION RING
- Publication number 20120086098
- Publication date Apr 12, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE
- Publication number 20120063093
- Publication date Mar 15, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR
- Publication number 20120061570
- Publication date Mar 15, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Walter Meinel
- G01 - MEASURING TESTING
Information Patent Application
SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...
- Publication number 20110294246
- Publication date Dec 1, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...
- Publication number 20110291222
- Publication date Dec 1, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Walter B. Meinel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS, AND METHODS
- Publication number 20110147869
- Publication date Jun 23, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Kalin V. Lazarov
- G01 - MEASURING TESTING

Kalin Valeriev LAZAROV

Person

Patents Grantslast 30 patents

ADC with precision reference power saving mode

Low temperature coefficient current sensor

Low temperature coefficient current sensor

Infrared sensor design using an epoxy film as an infrared absorptio...

Reference signal correction circuit

Infrared sensor design using an epoxy film as an infrared absorptio...

High speed on-chip precision buffer with switched-load rejection

On-chip calibration system and method for infrared sensor

Power supply system and method

Infrared sensor structure and method

On-chip calibration system and method for infrared sensor

Reducing thermal gradients to improve thermopile performance

Etching cavity structures in silicon under dielectric membrane

Accurate current sensing with heat transfer correction

Infrared light transmissivity for a membrane sensor

Heated air mass WCSP package and method for accelerometer

Infrared sensor structure and method

Method and apparatus for reducing thermopile variations

Ionic isolation ring

Infrared light transmissivity for a membrane sensor

Vias in substrate between IC seat and peripheral thermal cage

Integrated infrared sensors with optical elements, and methods

On-chip calibration system and method for infrared sensor

Silicon dioxide cantilever support and method for silicon etched st...

Silicon dioxide cantilever support and method for silicon etched st...

Silicon dioxide cantilever support and method for silicon etched st...

Patents Applicationslast 30 patents

ADC WITH PRECISION REFERENCE POWER SAVING MODE

PACKAGE STRESS SENSOR

PACKAGE STRESS SENSOR WITH HALL CANCELLATION

LOW TEMPERATURE COEFFICIENT CURRENT SENSOR

LOW TEMPERATURE COEFFICIENT CURRENT SENSOR

HIGH SPEED ON-CHIP PRECISION BUFFER WITH SWITCHED-LOAD REJECTION

STRESS-IMPAIRED SIGNAL CORRECTION CIRCUIT

MULTIPLE TEMPERATURE TESTING OF NON-VOLATILE MEMORY DATA RETENTION...

INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...

ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR

INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...

POWER SUPPLY SYSTEM AND METHOD

ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR

INFRARED SENSOR STRUCTURE AND METHOD

INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR

REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE

EXTENDED AREA COVER PLATE FOR INTEGRATED INFRARED SENSOR

INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS AND METHODS

Heated air mass WCSP package and method for accelerometer

INFRARED SENSOR DESIGN USING AN EPOXY FILM AS AN INFRARED ABSORPTIO...

Accurate Current Sensing with Heat Transfer Correction

Infrared gesture recognition device and method

ON-CHIP CALIBRATION SYSTEM AND METHOD FOR INFRARED SENSOR

METHOD AND APPARATUS FOR REDUCING THERMOPILE VARIATIONS

IONIC ISOLATION RING

REDUCING THERMAL GRADIENTS TO IMPROVE THERMOPILE PERFORMANCE

INFRARED LIGHT TRANSMISSIVITY FOR A MEMBRANE SENSOR

SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...

SILICON DIOXIDE CANTILEVER SUPPORT AND METHOD FOR SILICON ETCHED ST...

INTEGRATED INFRARED SENSORS WITH OPTICAL ELEMENTS, AND METHODS