Kalyana Ravindra Kantipudi

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for reusing manufacturing content across multi...
- Patent number 11,808,811
- Issue date Nov 7, 2023
- Intel Corporation
- Kalyana Kantipudi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuits with in-field diagnostic and repair capabilities
- Patent number 11,281,195
- Issue date Mar 22, 2022
- Intel Corporation
- Kenneth T. Daxer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and apparatus for detecting defects in memory circuitry
- Patent number 10,446,251
- Issue date Oct 15, 2019
- Intel Corporation
- Kalyana Ravindra Kantipudi
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques for testing programmable interconnect resources
- Patent number 10,394,981
- Issue date Aug 27, 2019
- Altera Corporation
- Kalyana Kantipudi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuits and methods for generating a clock enable signal using a s...
- Patent number 9,812,216
- Issue date Nov 7, 2017
- Altera Corporation
- Kalyana Kantipudi
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock control circuitry and methods of utilizing the clock control...
- Patent number 9,075,112
- Issue date Jul 7, 2015
- Altera Corporation
- Kalyana Ravindra Kantipudi
- G01 - MEASURING TESTING
Information Patent Grant
Test techniques and circuitry
- Patent number 9,021,323
- Issue date Apr 28, 2015
- Altera Corporation
- Jayabrata Gosh Dastidar
- G01 - MEASURING TESTING
Information Patent Grant
Clock control circuitry and methods of utilizing the clock control...
- Patent number 8,621,303
- Issue date Dec 31, 2013
- Altera Corporation
- Kalyana Ravindra Kantipudi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test pattern generation system for programmable logic dev...
- Patent number 8,516,322
- Issue date Aug 20, 2013
- Altera Corporation
- Jayabrata Ghosh Dastidar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Architecture and Testing for an Integrated Circuit Package
- Publication number 20230341463
- Publication date Oct 26, 2023
- Kalyana Ravindra Kantipudi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...
- Publication number 20230288479
- Publication date Sep 14, 2023
- Intel Corporation
- Kalyana KANTIPUDI
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUITS WITH IN-FIELD DIAGNOSTIC AND REPAIR CAPABILITES
- Publication number 20190101906
- Publication date Apr 4, 2019
- Intel Corporation
- Kenneth T. Daxer
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND APPARATUS FOR DETECTING DEFECTS IN MEMORY CIRCUITRY
- Publication number 20180301201
- Publication date Oct 18, 2018
- Intel Corporation
- Kalyana Ravindra Kantipudi
- G11 - INFORMATION STORAGE

Kalyana Ravindra Kantipudi

Person

Patents Grantslast 30 patents

Apparatus and method for reusing manufacturing content across multi...

Integrated circuits with in-field diagnostic and repair capabilities

Methods and apparatus for detecting defects in memory circuitry

Techniques for testing programmable interconnect resources

Circuits and methods for generating a clock enable signal using a s...

Clock control circuitry and methods of utilizing the clock control...

Test techniques and circuitry

Clock control circuitry and methods of utilizing the clock control...

Automatic test pattern generation system for programmable logic dev...

Patents Applicationslast 30 patents

Architecture and Testing for an Integrated Circuit Package

APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...

INTEGRATED CIRCUITS WITH IN-FIELD DIAGNOSTIC AND REPAIR CAPABILITES

METHODS AND APPARATUS FOR DETECTING DEFECTS IN MEMORY CIRCUITRY