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Kambiz Munshi
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Framingham, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Decision feedback equalizer circuit with transistor mobility change...
Patent number
10,911,269
Issue date
Feb 2, 2021
Intel Corporation
Anup J. Deka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus, system, and method for voltage swing and duty cycle adju...
Patent number
9,160,320
Issue date
Oct 13, 2015
Intel Corporation
Eduard Roytman
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus, system, and method for voltage swing and duty cycle adju...
Patent number
8,542,046
Issue date
Sep 24, 2013
Intel Corporation
Eduard Roytman
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit package resistance measurement
Patent number
7,327,150
Issue date
Feb 5, 2008
Intel Corporation
Arvind Kumar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD TO REDUCE MEMORY POWER CONSUMPTION IN A MEMORY...
Publication number
20240193109
Publication date
Jun 13, 2024
Intel Corporation
Michelle M. WIGTON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DECISION FEEDBACK EQUALIZER CIRCUIT WITH TRANSISTOR MOBILITY CHANGE...
Publication number
20190013973
Publication date
Jan 10, 2019
Intel Corporation
Anup J. DEKA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
APPARATUS, SYSTEM, AND METHOD FOR VOLTAGE SWING AND DUTY CYCLE ADJU...
Publication number
20140085123
Publication date
Mar 27, 2014
Eduard ROYTMAN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
APPARATUS, SYSTEM, AND METHOD FOR VOLTAGE SWING AND DUTY CYCLE ADJU...
Publication number
20120280732
Publication date
Nov 8, 2012
Eduard Roytman
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CROSS-FEEDBACK PHASE-LOCKED LOOP FOR DISTRIBUTED CLOCKING SYSTEMS
Publication number
20110248755
Publication date
Oct 13, 2011
William C. Hasenplaugh
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Integrated circuit package resistance measurement
Publication number
20070080696
Publication date
Apr 12, 2007
Intel Corporation
Arvind Kumar
G01 - MEASURING TESTING