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Kameshwar Polla
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Berkeley, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Sensor geometry correction methods and apparatus
Patent number
6,741,945
Issue date
May 25, 2004
OnWafer Technologies, Inc.
Kameshwar Polla
G01 - MEASURING TESTING
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Patent Grant
Data collection and correction methods and apparatus
Patent number
6,738,722
Issue date
May 18, 2004
OnWafer Technologies, Inc.
Kameshwar Polla
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Data collection and correction methods and apparatus
Publication number
20020177917
Publication date
Nov 28, 2002
Kameshwar Polla
G01 - MEASURING TESTING