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Kamran Firooz
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Loveland, CO, US
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last 30 patents
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Patent Grant
Method for creating an in-circuit test for an electronic device
Patent number
5,590,136
Issue date
Dec 31, 1996
Hewlett-Packard Co.
Kamran Firooz
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing an electronic circuit having an arbitrary out...
Patent number
5,066,909
Issue date
Nov 19, 1991
Hewlett-Packard Company
Kamran Firooz
G01 - MEASURING TESTING
Information
Patent Grant
Modular/concurrent board tester
Patent number
5,032,789
Issue date
Jul 16, 1991
Hewlett-Packard Company
Kamran Firooz
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and apparatus which enable elimination of setup time and h...
Patent number
4,799,023
Issue date
Jan 17, 1989
Hewlett-Packard Company
Kamran Firooz
G01 - MEASURING TESTING