Kan TAN

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Eye classes separator with overlay, and composite, and dynamic eye-...
- Patent number 12,328,242
- Issue date Jun 10, 2025
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Transmitter equalizer tap extraction
- Patent number 12,301,695
- Issue date May 13, 2025
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Bit error ratio estimation using machine learning
- Patent number 12,146,914
- Issue date Nov 19, 2024
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Combined TDECQ measurement and transmitter tuning using machine lea...
- Patent number 11,940,889
- Issue date Mar 26, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical transmitter tuning using machine learning and reference par...
- Patent number 11,923,895
- Issue date Mar 5, 2024
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Machine learning for taps to accelerate TDECQ and other measurements
- Patent number 11,907,090
- Issue date Feb 20, 2024
- Tektronix, Inc.
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real-equivalent-time oscilloscope with time domain reflectometer
- Patent number 11,898,927
- Issue date Feb 13, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Real-equivalent-time oscilloscope
- Patent number 11,789,051
- Issue date Oct 17, 2023
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Explicit solution for DFE optimization with constraints
- Patent number 11,765,002
- Issue date Sep 19, 2023
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Low frequency S-parameter measurement
- Patent number 11,598,805
- Issue date Mar 7, 2023
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Passive variable continuous time linear equalizer with attenuation...
- Patent number 10,904,042
- Issue date Jan 26, 2021
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for de-embedding a combiner from a balanced si...
- Patent number 10,895,588
- Issue date Jan 19, 2021
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multirate data for S-parameter extraction
- Patent number 10,862,717
- Issue date Dec 8, 2020
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Equalizer for limited intersymbol interference
- Patent number 10,476,704
- Issue date Nov 12, 2019
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-band noise reduction systems and methods
- Patent number 10,432,434
- Issue date Oct 1, 2019
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Group delay based averaging
- Patent number 10,345,339
- Issue date Jul 9, 2019
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Offset stacked compressor amplifiers in a discrete digitizer system...
- Patent number 10,274,520
- Issue date Apr 30, 2019
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter and eye contour at BER measurements after DFE
- Patent number 10,209,276
- Issue date Feb 19, 2019
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
S-parameter measurements using real-time oscilloscopes
- Patent number 10,145,874
- Issue date Dec 4, 2018
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Equalizer for limited intersymbol interference
- Patent number 10,075,286
- Issue date Sep 11, 2018
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Serial data link measurement and simulation system
- Patent number 10,073,750
- Issue date Sep 11, 2018
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Band overlay separator
- Patent number 9,933,458
- Issue date Apr 3, 2018
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock recovery for data signals
- Patent number 9,596,074
- Issue date Mar 14, 2017
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for performing joint jitter and amplitude noise analysis on...
- Patent number 9,294,237
- Issue date Mar 22, 2016
- Tektronix, Inc.
- Mark L. Guenther
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and systems for providing optimum decision feedback equaliz...
- Patent number 9,191,245
- Issue date Nov 17, 2015
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and systems for analyzing decomposed uncorrelated signal im...
- Patent number 9,130,751
- Issue date Sep 8, 2015
- Tektronix, Inc.
- Pavel R. Zivny
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Re-sampling S-parameters for serial data link analysis
- Patent number 8,891,603
- Issue date Nov 18, 2014
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and systems for providing optimum decision feedback equaliz...
- Patent number 8,855,186
- Issue date Oct 7, 2014
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Arbitrary multiband overlay mixer apparatus and method for bandwidt...
- Patent number 8,588,703
- Issue date Nov 19, 2013
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Arbitrary multiband overlay mixer apparatus and method for bandwidt...
- Patent number 8,463,224
- Issue date Jun 11, 2013
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDE...
- Publication number 20250102573
- Publication date Mar 27, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
WIDEBAND SIGNAL GENERATOR
- Publication number 20250023578
- Publication date Jan 16, 2025
- Tektronix, Inc.
- Kan TAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MARGIN TESTER MEASUREMENT USING MACHINE LEARNING
- Publication number 20250020713
- Publication date Jan 16, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION
- Publication number 20250004014
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING
- Publication number 20250004015
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
USER INTERFACE FOR A TENSOR BUILDER TO CONSTRUCT IMAGES FOR INPUT T...
- Publication number 20240393918
- Publication date Nov 28, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...
- Publication number 20240393369
- Publication date Nov 28, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM A...
- Publication number 20240313795
- Publication date Sep 19, 2024
- Tektronix, Inc.
- Kan TAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATED CHANNEL CHARACTERIZATION FOR MACHINE-LEARNING-BASED RIS-A...
- Publication number 20240243779
- Publication date Jul 18, 2024
- Tektronix, Inc.
- Kan Tan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR TUNING AND MEASURING A DEVICE UNDER TEST US...
- Publication number 20240235669
- Publication date Jul 11, 2024
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF...
- Publication number 20240168471
- Publication date May 23, 2024
- Tektronix, Inc.
- Kan Tan
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS FOR 3D TENSOR BUILDER FOR INPUT TO MACHINE LEARNING
- Publication number 20240169210
- Publication date May 23, 2024
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE
- Publication number 20240151753
- Publication date May 9, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE INSTRUMENT NOISE REMOVAL
- Publication number 20240125837
- Publication date Apr 18, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING FOR MEASUREMENT USING LINEAR RESPONSE EXTRACTED FR...
- Publication number 20230408558
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING TEST DATA USING PRINCIPAL COMPONENT ANALYSIS
- Publication number 20230409451
- Publication date Dec 21, 2023
- Tektronix, Inc.
- Justin E. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY I...
- Publication number 20230408550
- Publication date Dec 21, 2023
- Tektronix, Inc.
- John J. PICKERD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED CAVITY FILTER TUNING USING MACHINE LEARNING
- Publication number 20230398694
- Publication date Dec 14, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSMITTER EQUALIZER TAP EXTRACTION
- Publication number 20230370242
- Publication date Nov 16, 2023
- Tektronix, Inc.
- Kan TAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ENTROPY ON ONE-DIMENSIONAL AND TWO-DIMENSIONAL HISTOGRAMS
- Publication number 20230184810
- Publication date Jun 15, 2023
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQU...
- Publication number 20230070298
- Publication date Mar 9, 2023
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING FOR TAPS TO ACCELERATE TDECQ AND OTHER MEASUREMENTS
- Publication number 20230050162
- Publication date Feb 16, 2023
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED TDECQ MEASUREMENT AND TRANSMITTER TUNING USING MACHINE LEA...
- Publication number 20230050303
- Publication date Feb 16, 2023
- Tektronix, Inc.
- John J. PICKERD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...
- Publication number 20220390515
- Publication date Dec 8, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
EXPLICIT SOLUTION FOR DFE OPTIMIZATION WITH CONSTRAINTS
- Publication number 20220393914
- Publication date Dec 8, 2022
- Tektronix, Inc.
- Kan TAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BIT ERROR RATIO ESTIMATION USING MACHINE LEARNING
- Publication number 20220373597
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE WITH TIME DOMAIN REFLECTOMETER
- Publication number 20220357237
- Publication date Nov 10, 2022
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE
- Publication number 20220334180
- Publication date Oct 20, 2022
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL TRANSMITTER TUNING USING MACHINE LEARNING AND REFERENCE PAR...
- Publication number 20220311513
- Publication date Sep 29, 2022
- Tektronix, Inc.
- John J. Pickerd
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Person

Patents Grantslast 30 patents

Eye classes separator with overlay, and composite, and dynamic eye-...

Transmitter equalizer tap extraction

Bit error ratio estimation using machine learning

Combined TDECQ measurement and transmitter tuning using machine lea...

Optical transmitter tuning using machine learning and reference par...

Machine learning for taps to accelerate TDECQ and other measurements

Real-equivalent-time oscilloscope with time domain reflectometer

Real-equivalent-time oscilloscope

Explicit solution for DFE optimization with constraints

Low frequency S-parameter measurement

Passive variable continuous time linear equalizer with attenuation...

Apparatus and method for de-embedding a combiner from a balanced si...

Multirate data for S-parameter extraction

Equalizer for limited intersymbol interference

Multi-band noise reduction systems and methods

Group delay based averaging

Offset stacked compressor amplifiers in a discrete digitizer system...

Jitter and eye contour at BER measurements after DFE

S-parameter measurements using real-time oscilloscopes

Equalizer for limited intersymbol interference

Serial data link measurement and simulation system

Band overlay separator

Clock recovery for data signals

Method for performing joint jitter and amplitude noise analysis on...

Methods and systems for providing optimum decision feedback equaliz...

Methods and systems for analyzing decomposed uncorrelated signal im...

Re-sampling S-parameters for serial data link analysis

Methods and systems for providing optimum decision feedback equaliz...

Arbitrary multiband overlay mixer apparatus and method for bandwidt...

Arbitrary multiband overlay mixer apparatus and method for bandwidt...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDE...

WIDEBAND SIGNAL GENERATOR

MARGIN TESTER MEASUREMENT USING MACHINE LEARNING

MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION

INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING

USER INTERFACE FOR A TENSOR BUILDER TO CONSTRUCT IMAGES FOR INPUT T...

REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...

REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM A...

AUTOMATED CHANNEL CHARACTERIZATION FOR MACHINE-LEARNING-BASED RIS-A...

SYSTEMS AND METHODS FOR TUNING AND MEASURING A DEVICE UNDER TEST US...

INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF...

METHODS FOR 3D TENSOR BUILDER FOR INPUT TO MACHINE LEARNING

REAL-EQUIVALENT-TIME OSCILLOSCOPE

ADAPTIVE INSTRUMENT NOISE REMOVAL

MACHINE LEARNING FOR MEASUREMENT USING LINEAR RESPONSE EXTRACTED FR...

GENERATING TEST DATA USING PRINCIPAL COMPONENT ANALYSIS

SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY I...

AUTOMATED CAVITY FILTER TUNING USING MACHINE LEARNING

TRANSMITTER EQUALIZER TAP EXTRACTION

ENTROPY ON ONE-DIMENSIONAL AND TWO-DIMENSIONAL HISTOGRAMS

REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQU...

MACHINE LEARNING FOR TAPS TO ACCELERATE TDECQ AND OTHER MEASUREMENTS

COMBINED TDECQ MEASUREMENT AND TRANSMITTER TUNING USING MACHINE LEA...

GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...

EXPLICIT SOLUTION FOR DFE OPTIMIZATION WITH CONSTRAINTS

BIT ERROR RATIO ESTIMATION USING MACHINE LEARNING

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT

REAL-EQUIVALENT-TIME OSCILLOSCOPE WITH TIME DOMAIN REFLECTOMETER

REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE

OPTICAL TRANSMITTER TUNING USING MACHINE LEARNING AND REFERENCE PAR...