Kana NEMOTO

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring pattern shape, method of manufacturing semicond...
- Patent number 8,227,265
- Issue date Jul 24, 2012
- Renesas Electronics Corporation
- Kana Nemoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING PATTERN SHAPE, METHOD OF MANUFACTURING SEMICOND...
- Publication number 20110020956
- Publication date Jan 27, 2011
- Renesas Electronics Corporation
- Kana NEMOTO
- G01 - MEASURING TESTING